Patents by Inventor Romano Perego

Romano Perego has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing contactor for small-size semiconductor devices
    Patent number: 5565787
    Abstract: A testing contactor is provided for testing small-size semiconductor devices with large currents at high frequencies. Each semiconductor device to be tested has a plurality of leads. The testing contactor includes a plurality of first electric contact elements. A first Kelvin contact for a lead is formed of a first electric contact element in contact with the lead. The testing contactor further includes a plurality of second electric contact elements and a plurality of electric connection elements. An electric connection element in contact with the lead effectively extends the lead. A second Kelvin contact is formed of a second electric contact element and an electric connection element, the second electric contact element in contact with the electric connection element and the electric connection element in contact with the lead.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: October 15, 1996
    Assignee: SGS-Thomson Microelectronics S.r.l.
    Inventor: Romano Perego
  • Testing contactor for small-size semiconductor devices
    Patent number: 5521521
    Abstract: A testing contactor is provided for testing small-size semiconductor devices with large currents at high frequencies. Each semiconductor device to be tested has a plurality of leads. The testing contactor includes a plurality of first electric contact elements. A first Kelvin contact for a lead is formed of a first electric contact element in contact with the lead. The testing contactor further includes a plurality of second electric contact elements and a plurality of electric connection elements. An electric connection element in contact with the lead effectively extends the lead. A second Kelvin contact is formed of a second electric contact element and an electric connection element, the second electric contact element in contact with the electric connection element and the electric connection element in contact with the lead.
    Type: Grant
    Filed: March 14, 1994
    Date of Patent: May 28, 1996
    Assignee: SGS-Thomson Microelectronics, S.r.l.
    Inventor: Romano Perego
  • Testing contactor for small-size semiconductor devices
    Patent number: 5504435
    Abstract: A testing contactor is provided for testing small-size semiconductor devices with large currents at high frequencies. Each semiconductor device to be tested has a plurality of leads. The testing contactor includes a plurality of first electric contact elements. A first Kelvin contact for a lead is formed of a first electric contact element in contact with the lead. The testing contactor further includes a plurality of second electric contact elements and a plurality of electric connection elements. An electric connection element in contact with the lead effectively extends the lead. A second Kelvin contact is formed of a second electric contact element and an electric connection element, the second electric contact element in contact with the electric connection element and the electric connection element in contact with the lead.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: April 2, 1996
    Assignee: SGS-Thomson Microelectronics S.r.l.
    Inventor: Romano Perego