Patents by Inventor Ron Dalesky

Ron Dalesky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030075108
    Abstract: A configuration of various chemical compound generators coupled to a furnace provides the environment for formation of extremely thin oxides of silicon on a wafer. Dichloroethylene is reacted with oxygen in a first heated reaction chamber and reaction products therefrom are diluted with a gas such as nitrogen and then introduced into a vertically oriented furnace maintained at an elevated temperature and having rotating wafers therein. Hydrogen and oxygen are catalytically reacted to form steam in a second heated reaction chamber, the steam is diluted with a gas such as nitrogen and introduced into the vertical diffusion furnace. In a further aspect of the present invention, MOSFETs having gate dielectric layers of extremely thin oxides of silicon are formed.
    Type: Application
    Filed: November 20, 2002
    Publication date: April 24, 2003
    Applicant: Intel Corporation
    Inventors: Reza Arghavani, Robert Chau, Ron Dalesky
  • Patent number: 6514879
    Abstract: A configuration of various chemical compound generators coupled to a furnace provides the environment for formation of extremely thin oxides of silicon on a wafer. Dichloroethylene is reacted with oxygen in a first heated reaction chamber and reaction products therefrom are diluted with a gas such as nitrogen and then introduced into a vertically oriented furnace maintained at an elevated temperature and having rotating wafers therein. Hydrogen and oxygen are catalytically reacted to form steam in a second heated reaction chamber, the steam is diluted with a gas such as nitrogen and introduced into the vertical diffusion furnace. In a further aspect of the present invention, MOSFETs having gate dielectric layers of extremely thin oxides of silicon are formed.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: February 4, 2003
    Assignee: Intel Corporation
    Inventors: Reza Arghavani, Robert Chau, Ron Dalesky
  • Publication number: 20020052123
    Abstract: A configuration of various chemical compound generators coupled to a furnace provides the environment for formation of extremely thin oxides of silicon on a wafer. Dichloroethylene is reacted with oxygen in a first heated reaction chamber and reaction products therefrom are diluted with a gas such as nitrogen and then introduced into a vertically oriented furnace maintained at an elevated temperature and having rotating wafers therein. Hydrogen and oxygen are catalytically reacted to form steam in a second heated reaction chamber, the steam is diluted with a gas such as nitrogen and introduced into the vertical diffusion furnace. In a further aspect of the present invention, MOSFETs having gate dielectric layers of extremely thin oxides of silicon are formed.
    Type: Application
    Filed: December 17, 1999
    Publication date: May 2, 2002
    Inventors: REZA ARGHAVANI, ROBERT S. CHAU, RON DALESKY