Patents by Inventor Ron Naftail

Ron Naftail has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning system and method for scanning an object
    Patent number: 9958670
    Abstract: A scanning system that includes an illumination module that is configured to scan, at a first direction, an elongated radiation spot over an object; and a collection module that is configured to (a) collect a collected radiation beam from the object, and (b) optically manipulate the collected radiation beam to provide a counter-scan beam is directed towards a set of detection units and has a focal point that is positioned at a same location regardless of the propagation of the elongated radiation spot along the first direction.
    Type: Grant
    Filed: September 20, 2016
    Date of Patent: May 1, 2018
    Assignee: Applied Materials Israel Ltd.
    Inventors: Ron Naftail, Boris Golberg, Rami Elichai
  • SCANNING SYSTEM AND METHOD FOR SCANNING AN OBJECT
    Publication number: 20180081166
    Abstract: A scanning system that includes an illumination module that is configured to scan, at a first direction, an elongated radiation spot over an object; and a collection module that is configured to (a) collect a collected radiation beam from the object, and (b) optically manipulate the collected radiation beam to provide a counter-scan beam is directed towards a set of detection units and has a focal point that is positioned at a same location regardless of the propagation of the elongated radiation spot along the first direction.
    Type: Application
    Filed: September 20, 2016
    Publication date: March 22, 2018
    Inventors: Ron Naftail, Boris Golberg, Rami Elichai