Abstract: This disclosure describes, according to some implementations, a method for scoring electronic meeting requests for attendee redundancy. In an example method, the method includes retrieving, using one or more processors, user IDs of meeting attendees; retrieving, using the one or more processors, one or more characteristics associated with the user IDs; retrieving, using the one or more processors, a rule having one or more parameters for scoring meeting composition; comparing, using the one or more processors, the one or more characteristics associated with the user IDs based on the one or more parameters of the rule; and generating, using the one or more processors, a meeting score based on the comparison.

Abstract: This disclosure describes, according to some implementations, a method that includes deploying a meter coupled to a private computer network. The meter captures packet data sent or received by network nodes coupled to the private computer network. Portions of the network nodes are associated with different physical spaces. The method further monitors activity of the network nodes in association with the different physical spaces based on the captured packet data, and determines, for a particular period of time, a utilization of a physical asset, which is located in a particular physical space of the different physical spaces, based on the monitored activity of a network node from the network nodes that represents the physical asset.

Abstract: This disclosure describes, according to some implementations, a method for scoring electronic meeting requests for attendee redundancy. In an example method, the method includes retrieving, using one or more processors, user IDs of meeting attendees; retrieving, using the one or more processors, one or more characteristics associated with the user IDs; retrieving, using the one or more processors, a rule having one or more parameters for scoring meeting composition; comparing, using the one or more processors, the one or more characteristics associated with the user IDs based on the one or more parameters of the rule; and generating, using the one or more processors, a meeting score based on the comparison. From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the scope of the invention.

Abstract: This disclosure describes, according to some implementations, a method for scoring electronic meeting requests for attendee redundancy. In an example method, the method includes retrieving, using one or more processors, user IDs of meeting attendees; retrieving, using the one or more processors, one or more characteristics associated with the user IDs; retrieving, using the one or more processors, a rule having one or more parameters for scoring meeting composition; comparing, using the one or more processors, the one or more characteristics associated with the user IDs based on the one or more parameters of the rule; and generating, using the one or more processors, a meeting score based on the comparison. From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the scope of the invention.

Abstract: This disclosure describes, according to some implementations, a method for scoring electronic meeting requests for attendee redundancy. In an example method, the method includes retrieving, using one or more processors, user IDs of meeting attendees; retrieving, using the one or more processors, one or more characteristics associated with the user IDs; retrieving, using the one or more processors, a rule having one or more parameters for scoring meeting composition; comparing, using the one or more processors, the one or more characteristics associated with the user IDs based on the one or more parameters of the rule; and generating, using the one or more processors, a meeting score based on the comparison. From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the scope of the invention.

Abstract: This disclosure describes, according to some implementations, a method for scoring electronic meeting requests for attendee redundancy. In an example method, the method includes retrieving, using one or more processors, user IDs of meeting attendees; retrieving, using the one or more processors, one or more characteristics associated with the user IDs; retrieving, using the one or more processors, a rule having one or more parameters for scoring meeting composition; comparing, using the one or more processors, the one or more characteristics associated with the user IDs based on the one or more parameters of the rule; and generating, using the one or more processors, a meeting score based on the comparison.

Abstract: A label holder having a thin, flexible, film-like element preferably integrally formed at its upper edge to overly the apertured merchandise-supporting surface of a shelf. The film-like element is piercable by a push pin or the like to secure the upper portions of the label holder to the shelf and the lower portions of the label holder are secured to or about the lower edge of the front lip on the shelf or a rearwardly directed lower shelf flange.

Abstract: A method for improving yield management of semiconductors being inspected for defects. The method uses critical area analysis, spacial analysis, yield loss node analysis, yield loss manufacturing location, and yield loss cause analysis for both in-line monitors and at each node due to situational circumstances.

Abstract: A method of calculating yield limits for a factory to process semiconductor wafers, including the steps of generating a wafer map from the semiconductor wafers, eliminating die on said wafer map from consideration that have multiple defects, calculating killer probability for each of said die having only one defect, and predicting yield limits from said killer probabilities.

Abstract: A method for predicting yield limits of semiconductor wafers in a factory, including the steps of generating a wafer probe test pareto, determining a histogram of the distribution from a selected group from the wafer probe test pareto, extracting parametric data from a database from the histogram, screening the parametric data for values of the parametric data outside of a predetermined range, determining if an average value of the screened parametric data shows a sensitivity to variations in the parametric data, determining specification limits of the screened parametric data, and using the specification limits to form an operating window to show the sensitivity.

Abstract: A computer program protection method which permits copying of the program by a user, but which incorporates a novel information coding technique to prevent operational response by the computer using a copy.