Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition, where the write-back indicator is a discrete signal sent to a memory controller, and the at least one non-volatile memory device asserting the write-back indicator extends cycle timing monitored by the memory controller while the write-back indicator is asserted. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition, where the write-back indicator is a discrete signal sent to a memory controller, and the at least one non-volatile memory device asserting the write-back indicator extends cycle timing monitored by the memory controller while the write-back indicator is asserted. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.

Abstract: A method for implementing improved observability of random resistant logic included in an integrated circuit (IC) design includes configuring a multiplexer device to pass, to a preexisting storage latch within the design, one of: a signal from one or more observation points within the random resistant logic and an output of first preexisting combinational logic; and selecting a preexisting net within the IC design to generate a randomized logic signal that, in a test mode, is passed to the multiplexer device to serve as a control signal thereto; wherein, in the test mode, the existing storage latch captures data randomly selected from either the existing combinational logic and the one or more observation points and in a normal mode, the existing storage latch captures data from only the existing combinational logic, facilitating random testing of the random resistant logic in a manner that avoids adding latches to the design.

Abstract: A method for implementing improved observability of random resistant logic included in an integrated circuit (IC) design includes configuring a multiplexer device to pass, to a preexisting storage latch within the design, one of: a signal from one or more observation points within the random resistant logic and an output of first preexisting combinational logic; and selecting a preexisting net within the IC design to generate a randomized logic signal that, in a test mode, is passed to the multiplexer device to serve as a control signal thereto; wherein, in the test mode, the existing storage latch captures data randomly selected from either the existing combinational logic and the one or more observation points and in a normal mode, the existing storage latch captures data from only the existing combinational logic, facilitating random testing of the random resistant logic in a manner that avoids adding latches to the design.