Patents by Inventor Ronal French

Ronal French has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for defect reduction analysis
    Publication number: 20060265188
    Abstract: In a first aspect, a first method is provided for providing a service for performing Orthogonal Defect Classification (ODC) analysis. The first method includes the steps of (1) querying a customer about a level of service desired for a customer defect analysis project; (2) configuring a customer defect data collection tool for ODC; (3) adapting a defect data transfer tool to transfer defect data from the defect data collection tool; (4) transferring the defect data to a database structured to be accessible by an ODC analysis tool; and (5) performing ODC analysis on the defect data using the ODC analysis tool. Numerous other aspects are provided.
    Type: Application
    Filed: May 5, 2005
    Publication date: November 23, 2006
    Applicant: International Business Machines Corporation
    Inventors: Ronal French, Brian Lepel, Susan Skrabanek, Suzanne Smith, James Walters