Patents by Inventor Ronald A. Synowicki

Ronald A. Synowicki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of determining refractive indices and surface properties of prism shaped material
    Patent number: 10466171
    Abstract: Methodology of characterizing surface properties and determining refractive index and extinction coefficient of a prism shaped material, including simultaneously for a multiplicity of wavelengths, using an easy to practice technique.
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: November 5, 2019
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Ronald A. Synowicki, Joel J. Mohrmann
  • Method of determining refractive index, extinction coefficient, and surface properties of prism shaped material
    Patent number: 10309897
    Abstract: Methodology of characterizing surface properties and determining refractive index and extinction coefficient of a prism shaped material, including simultaneously for a multiplicity of wavelengths, using an easy to practice technique.
    Type: Grant
    Filed: February 27, 2017
    Date of Patent: June 4, 2019
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Ronald A. Synowicki, Joel J. Mohrmann
  • Method of determining refractive index, extinction coefficient, and surface properties of prism shaped material
    Publication number: 20170254748
    Abstract: Methodology of characterizing surface properties and determining refractive index and extinction coefficient of a prism shaped material, including simultaneously for a multiplicity of wavelengths, using an easy to practice technique.
    Type: Application
    Filed: February 27, 2017
    Publication date: September 7, 2017
    Applicant: J. A. WOOLLAM CO. INC.
    Inventors: Ronald A. Synowicki, Joel J. Mohrmann
  • Method of determining refractive index of prism shaped material
    Patent number: 8692985
    Abstract: Methodology of determining refractive index and extinction coefficient of a prism shaped material, including simultaneously for a multiplicity of wavelengths using an easy to practice technique.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: April 8, 2014
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ronald A. Synowicki, Greg K. Pribil, Andrew C. Martin
  • Sample investigating system and method of use
    Patent number: 8159672
    Abstract: A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.
    Type: Grant
    Filed: November 19, 2009
    Date of Patent: April 17, 2012
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, Ronald A. Synowicki, John A. Woollam
  • Ellipsometric investigation of anisotropic samples
    Patent number: 7777883
    Abstract: A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as if the sample is isotropic.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: August 17, 2010
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ronald A. Synowicki, Thomas E. Tiwald
  • Sample investigating system
    Patent number: 7623237
    Abstract: A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: November 24, 2009
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, Ronald A. Synowicki, John A. Woollam
  • Ellipsometric investigation of anisotropic samples
    Publication number: 20080266559
    Abstract: A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as if the sample is isotropic.
    Type: Application
    Filed: June 10, 2008
    Publication date: October 30, 2008
    Inventors: Ronald Synowicki, Thomas E. Tiwald
  • Sample analysis methodology utilizing electromagnetic radiation
    Patent number: 7385697
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: June 10, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Method of analysis of multiple layer samples
    Patent number: 7239391
    Abstract: Spectroscopic ellipsometer system(s) mediated methodology for quantifying layer defining parameters in mathematical models of samples which contain a plurality of layers of different materials, at least some of which are absorbing of electromagentic radiation, wherein an acquired data set is not sufficient to allow definite one for one parameter evaluation, and wherein a global fit procedure can be applied to obtain good parameter starting values for use in a parameter evaluating regression procedure.
    Type: Grant
    Filed: April 2, 2005
    Date of Patent: July 3, 2007
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ronald A. Synowicki, Craig M. Herzinger
  • Method of determining bulk refractive indicies of liquids from thin films thereof
    Patent number: 7187443
    Abstract: Disclosed is a method for determination of bulk refractive indicies of flowable liquids utilizing thin films thereof on a roughened surface of a rigid or semi-rigid object.
    Type: Grant
    Filed: April 14, 2004
    Date of Patent: March 6, 2007
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ronald A. Synowicki, Thomas E. Tiwald
  • Methodology for providing good data at all wavelengths over a spectroscopic range
    Patent number: 7151605
    Abstract: Disclosed is methodology for obtaining data of improved precision, including detection and replacement of data determined to be suspect to provide good data over a spectroscopic range of wavelengths.
    Type: Grant
    Filed: December 11, 2004
    Date of Patent: December 19, 2006
    Assignee: J.A. Woollam Co., Inc
    Inventors: Craig M. Herzinger, Steven E. Green, Ronald A. Synowicki, James D. Welch
  • Method of analysis of multiple layer samples
    Publication number: 20050179897
    Abstract: Spectroscopic ellipsometer system(s) mediated methodology for quantifying layer defining parameters in mathematical models of samples which contain a plurality of layers of different materials, at least some of which are absorbing of electromagentic radiation, wherein an acquired data set is not sufficient to allow definite one for one parameter evaluation, and wherein a global fit procedure can be applied to obtain good parameter starting values for use in a parameter evaluating regression procedure.
    Type: Application
    Filed: April 2, 2005
    Publication date: August 18, 2005
    Inventors: Ronald Synowicki, Craig Herzinger
  • Sample analysis methodology utilizing electromagnetic radiation
    Publication number: 20040257567
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Application
    Filed: May 20, 2004
    Publication date: December 23, 2004
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Methodology for improving precision of data acquired by spectrophotometer systems
    Patent number: 6831740
    Abstract: Disclosed are spectrophotometer systems and methodology for obtaining data of improved precision therefrom, including replacement of data determined to be suspect based on comparison of multiple baselines.
    Type: Grant
    Filed: August 9, 2001
    Date of Patent: December 14, 2004
    Assignee: J.A. Woollam Co. Inc.
    Inventors: Craig M. Herzinger, Steven E. Green, Ronald A. Synowicki
  • Method of determining bulk refractive indicies of fluids from thin films thereof
    Patent number: 6738139
    Abstract: Disclosed is a method for determination of bulk refractive indicies of fluids utilizing thin films thereof on a roughened surface of a two sided rigid or semi-rigid object.
    Type: Grant
    Filed: April 7, 2003
    Date of Patent: May 18, 2004
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ronald A. Synowicki, Thomas E. Tiwald
  • Methodology for improving precision of data acquired by spectrophotometer systems
    Publication number: 20020085200
    Abstract: Disclosed are spectrophotometer systems and methodology for obtaining data of improved precision therefrom, including replacement of data determined to be suspect based on comparison of multiple baselines.
    Type: Application
    Filed: August 9, 2001
    Publication date: July 4, 2002
    Inventors: Craig M. Herzinger, Steven E. Green, Ronald A. Synowicki