Patents by Inventor Ronald Bruce Harding

Ronald Bruce Harding has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of using SNR to reduce factory test time
    Patent number: 7912463
    Abstract: The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
    Type: Grant
    Filed: January 15, 2009
    Date of Patent: March 22, 2011
    Assignee: Research In Motion Limited
    Inventors: Xin Jin, Jennifer Mallalieu, Qingzhong Jiao, Ronald Bruce Harding
  • Method of using SNR to reduce factory test time
    Patent number: 7542764
    Abstract: The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: June 2, 2009
    Assignee: Research in Motion Limited
    Inventors: Xin Jin, Jennifer Mallalieu, Qingzhong Jiao, Ronald Bruce Harding
  • METHOD OF USING SNR TO REDUCE FACTORY TEST TIME
    Publication number: 20090124252
    Abstract: The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
    Type: Application
    Filed: January 15, 2009
    Publication date: May 14, 2009
    Applicant: Research In Motion Limited
    Inventors: Xin Jin, Jennifer Mallalieu, Qingzhong Jiao, Ronald Bruce Harding