Abstract: A method and apparatus are disclosed for optimizing operational performance of a disc drive. The disc drive is provided with an integrated temperature measurement circuit which provides a temperature measurement signal indicative of operational temperature of the disc drive. The integrated temperature measurement circuit is formed as part of an application specific integrated circuit (ASIC) housing additional circuitry used by the disc drive during operation. A parametric configuration circuit, operably coupled to the integrated temperature measurement circuit, identifies selected parameters for use by the disc drive to optimize disc drive performance, the parameters arranged as a plurality of parameter sets corresponding to a plurality of predefined operational temperature ranges.