Abstract: A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.

Abstract: A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

Abstract: A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

Abstract: A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.

Abstract: A system may utilize at least an enclosed test deck that has an access port door covering an access port. The system can test a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port door with a tool of the exchange assembly. At least one data storage component may be installed into the interior test region and subsequently the access port is closed by installing the access port door into the access port.

Abstract: A system may utilize at least an enclosed test deck that has an access port door covering an access port. The system can test a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port door with a tool of the exchange assembly. At least one data storage component may be installed into the interior test region and subsequently the access port is closed by installing the access port door into the access port.

Abstract: A testing system that is capable of testing individual data storage components may have testing, loader, and exchange assemblies with the testing assembly having a plurality of test slots each having long and short axes. The loader assembly can be configured to transport and install a test deck or data storage device from the exchange assembly to a test slot of the plurality of test slots with a long axis of the test deck continuously aligned with the long axis of the test slot while being transported.

Abstract: A testing system that is capable of testing individual data storage components may have testing, loader, and exchange assemblies with the testing assembly having a plurality of test slots each having long and short axes. The loader assembly can be configured to transport and install a test deck or data storage device from the exchange assembly to a test slot of the plurality of test slots with a long axis of the test deck continuously aligned with the long axis of the test slot while being transported.

Abstract: A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.

Abstract: A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

Abstract: An apparatus and associated method for non-permanently fixturing an unmounted head gimbal assembly (UHGA). A backing plate has a planar body defining a plurality of contact points, and a lip extending from the body that is operably alignable with the UHGA so that a force applied against the lip transfers through the body to urge each of the contact points against the UHGA.

Abstract: An apparatus and associated method for non-permanently fixturing an unmounted head gimbal assembly (UHGA). A backing plate has a planar body defining a plurality of contact points, and a lip extending from the body that is operably alignable with the UHGA so that a force applied against the lip transfers through the body to urge each of the contact points against the UHGA.

Abstract: A device comprises a mounting surface configured to mount a head gimbal assembly (HGA), a housing that pivots relative to the mounting surface, and a mechanism coupled to the housing that deflects the HGA when the housing pivots relative to the mounting surface. For example the mechanism may be a pneumatically actuated finger that pulls the HGA towards the housing. The device may be used to load the HGA on a rotating test disc. Once loaded on the test disc, the HGA is supported only by the mounting surface and an air bearing at an interface of a slider of the HGA and the test disc. Embodiments of the invention may provide precise and repeatable positioning of the HGA because dimensional tolerances and vibrations in the mechanism are not transferred to the HGA once it is loaded on the test disc.

Abstract: A method of loading a head gimbal assembly on a disc includes attaching an unmounted head gimbal assembly to a four bar loader. The four bar loader includes a fixed plate, a pivot plate, and a four bar linkage connecting the fixed plate to the pivot plate. The four bar loader is then used to tilt the attached head gimbal assembly toward the surface of the disc.

Abstract: A method for dynamic electrical testing of head gimbal assemblies may include initiating an automated continuous process that includes selecting an unmounted head gimbal assembly; aligning the unmounted head gimbal assembly; loading the unmounted head gimbal assembly to a disc; and testing the unmounted head gimbal assembly.

Abstract: An assembly for testing a head gimbal assembly (HGA) comprises a support platform configured to hold a base plate of the HGA. A base plate of the HGA is mounted on the support platform. The assembly further comprises a channel with an opening adjacent to a tail of the HGA and a vacuum source connected the channel. The vacuum source creates a negative pressure in the channel to secure the tail of the HGA to the opening of the channel. Embodiments of the invention may be useful to inhibit vibration in the tail of an HGA, which may also reduce vibration in the head of the HGA. Reducing vibration in the head of the HGA may increase the accuracy and precision of tests performed on the HGA using the assembly.

Abstract: A method for dynamic electrical testing of head gimbal assemblies may include initiating an automated continuous process that includes selecting an unmounted head gimbal assembly; aligning the unmounted head gimbal assembly; loading the unmounted head gimbal assembly to a disc; and testing the unmounted head gimbal assembly.

Abstract: An assembly comprises a flex circuit including a first set of electrical contacts on a first side of the flex circuit and a compliant support backing adjacent a second side of the flex circuit and opposite the set of electrical contacts. The first set of electrical contacts is configured to connect to a second set of electrical contacts on an electronic component. The compliant support backing includes a set of support elements that individually support the first set of electrical contacts to increase the contact pressure between the first set of electrical contacts and the second set of electrical contacts when the flex circuit is connected to the electronic component. Embodiments may provide robust electrical contracts which provide a reliable connection useful for testing electronic components, such as head gimbal assemblies.

Abstract: An assembly for testing a head gimbal assembly (HGA) comprises a support platform configured to hold a base plate of the HGA. A base plate of the HGA is mounted on the support platform. The assembly further comprises a channel with an opening adjacent to a tail of the HGA and a vacuum source connected the channel. The vacuum source creates a negative pressure in the channel to secure the tail of the HGA to the opening of the channel. Embodiments of the invention may be useful to inhibit vibration in the tail of an HGA, which may also reduce vibration in the head of the HGA. Reducing vibration in the head of the HGA may increase the accuracy and precision of tests performed on the HGA using the assembly.

Abstract: A device comprises a mounting surface configured to mount a head gimbal assembly (HGA), a housing that pivots relative to the mounting surface, and a mechanism coupled to the housing that deflects the HGA when the housing pivots relative to the mounting surface. For example the mechanism may be a pneumatically actuated finger that pulls the HGA towards the housing. The device may be used to load the HGA on a rotating test disc. Once loaded on the test disc, the HGA is supported only by the mounting surface and an air bearing at an interface of a slider of the HGA and the test disc. Embodiments of the invention may provide precise and repeatable positioning of the HGA because dimensional tolerances and vibrations in the mechanism are not transferred to the HGA once it is loaded on the test disc.