Abstract: The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

Abstract: The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

Abstract: The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

Abstract: The invention encompasses a method of generating information about materials in a composition. A reagent is utilized to dissolve portions of the composition, and thereafter is filtered through a substrate which is then scanned with a microscope using automated displacement of the substrate to obtain data about the non-dissolved portions at locations along a grid pattern. Information about the size and quantity of the non-dissolved portions of the composition is generated. The invention also encompasses a method of generating information about impurities present in a metal composition. Metallic portions of the composition are selectively dissolved relative to impurities to form a solution. The solution is filtered through a substrate which is then scanned with a microscope to obtain data about a darkness of the impurities relative to a background. The data is processed to generate information about the size, quantity and type of the impurities.

Abstract: The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

Abstract: The invention includes a method for testing materials, such as for example sputtering target materials, other materials for electronics applications, or other materials in general in which homogeneity throughout the material is desired. A plurality of positions are defined across at least a portion of a material. Sonic energy is sequentially irradiated across the plurality of positions. Echoes are induced by the sonic energy, and detected. At least some of the detected echoes are associated with individual positions of the plurality of positions that triggered the detected echoes. Information pertaining to at least one physical attribute of the detected echoes is processed to sort the detected echoes into a first group indicative of inhomogeneities in the material, and a second group which does not indicate inhomogeneities in the material. The echoes of the first group are sorted into clusters, with the clusters being defined as echoes from adjacent positions of the plurality of positions.

Abstract: Neutron activation analysis method and apparatus are disclosed wherein a sample in a vacuum chamber is irradiated with neutrons, the time when and energy of emitted gamma rays from a sample are detected, and delayed Beta-electrons emitted from the sample are detected and the positions of emission are imaged. Time coincidence between detected gamma rays and delayed Beta-electrons is determined and the location of elements on the sample is established from the detected coincidence and the image of the location on the sample where the delayed Beta-electrons were emitted.