Abstract: According to some embodiments, an electrostatic particle accelerator may include an assembly having a motor and support plate; an acceleration tube; one or more stage assemblies each having an alternator coupled to a common drive shaft, a power supply coupled to one of the plurality of electrodes, and an opening to receive a portion of the acceleration tube; a pressure vessel configured to enclose the acceleration tube when the pressure vessel is fastened to the support plate; and a circulator configured to pump high pressure gas into the pressure vessel. The acceleration tube can include an ion source, an extraction assembly, and a plurality of tube segments each having a plurality of electrodes and one or more power connectors attached to one of the electrodes.

Abstract: An actuator assembly includes an actuator drive source and a gust lock. The actuator drive source is operable to supply an actuator drive torque to drive a component. The gust lock is movable between a locked position, in which rotation of the drive source is prevented, and an unlocked position, in which rotation of the drive source is not prevented. The gust lock includes a lock shaft, a lock rotor, a lock motor, and a linear actuator. The lock shaft is rotatable with the drive source when the gust lock is in the unlocked position. The lock rotor is rotatable with the lock shaft. The lock motor is configured to supply a lock drive torque. The linear actuator is coupled to receive the lock drive torque and is configured, upon receipt of the lock drive torque, to move between an engaged position and a disengaged position.

Abstract: An apparatus configured to generate a first sonar image from first sonar returns corresponding to a first depth range and generate a second sonar image from the first sonar returns and second sonar returns, the second sonar returns corresponding to a second depth range greater than the first depth range of the first sonar returns such that a portion of the second sonar image does not include sonar return data. The portion without sonar return data corresponds to a period of the first sonar returns and depths greater than the maximum depth of the first depth range. The apparatus is configured to generate and display a fill image for the portion of the second sonar image based on at least one set of side facing sonar return data corresponding to the time period associated with the first sonar returns.

Abstract: An apparatus configured to generate a first sonar image from first sonar returns corresponding to a first depth range and generate a second sonar image from the first sonar returns and second sonar returns, the second sonar returns corresponding to a second depth range greater than the first depth range of the first sonar returns such that a portion of the second sonar image does not include sonar return data. The portion without sonar return data corresponds to a period of the first sonar returns and depths greater than the maximum depth of the first depth range. The apparatus is configured to generate and display a fill image for the portion of the second sonar image based on at least one set of side facing sonar return data corresponding to the time period associated with the first sonar returns.

Abstract: According to some embodiments, an electrostatic particle accelerator may include an assembly having a motor and support plate; an acceleration tube; one or more stage assemblies each having an alternator coupled to a common drive shaft, a power supply coupled to one of the plurality of electrodes, and an opening to receive a portion of the acceleration tube; a pressure vessel configured to enclose the acceleration tube when the pressure vessel is fastened to the support plate; and a circulator configured to pump high pressure gas into the pressure vessel. The acceleration tube can include an ion source, an extraction assembly, and a plurality of tube segments each having a plurality of electrodes and one or more power connectors attached to one of the electrodes.

Abstract: An apparatus configured to generate a first sonar image from first sonar returns corresponding to a first depth range and generate a second sonar image from the first sonar returns and second sonar returns, the second sonar returns corresponding to a second depth range greater than the first depth range of the first sonar returns such that a portion of the second sonar image does not include sonar return data. The portion without sonar return data corresponds to a period of the first sonar returns and depths greater than the maximum depth of the first depth range. The apparatus is configured to generate and display a fill image for the portion of the second sonar image based on at least one set of side facing sonar return data corresponding to the time period associated with the first sonar returns.

Abstract: An apparatus configured to generate a first sonar image from first sonar returns corresponding to a first depth range and generate a second sonar image from the first sonar returns and second sonar returns, the second sonar returns corresponding to a second depth range greater than the first depth range of the first sonar returns such that a portion of the second sonar image does not include sonar return data. The portion without sonar return data corresponds to a period of the first sonar returns and depths greater than the maximum depth of the first depth range. The apparatus is configured to generate and display a fill image for the portion of the second sonar image based on at least one set of side facing sonar return data corresponding to the time period associated with the first sonar returns.

Abstract: Various implementations directed to a depth display using sonar data are provided. In one implementation, a marine electronics device may include a sonar signal processor and a memory having a plurality of program instructions which, when executed by the sonar signal processor, cause the processor to receive sonar data from a transducer array disposed on a vessel, where the sonar data corresponds to a marine environment proximate to the vessel. The memory may also have program instructions which, when executed by the sonar signal processor, cause the processor to generate point cloud data based on the received sonar data. The memory may further have program instructions which, when executed by the sonar signal processor, cause the processor to generate a depth display based on the point cloud data, where the depth display includes a depth line representing an underwater floor of the marine environment.

Abstract: Various implementations directed to a depth display using sonar data are provided. In one implementation, a marine electronics device may include a sonar signal processor and a memory having a plurality of program instructions which, when executed by the sonar signal processor, cause the processor to receive sonar data from a transducer array disposed on a vessel, where the sonar data corresponds to a marine environment proximate to the vessel. The memory may also have program instructions which, when executed by the sonar signal processor, cause the processor to generate point cloud data based on the received sonar data. The memory may further have program instructions which, when executed by the sonar signal processor, cause the processor to generate a depth display based on the point cloud data, where the depth display includes a depth line representing an underwater floor of the marine environment.

Abstract: Ion implant apparatus using a drum-type scan wheel holds wafers with a total cone angle less than 60°. A collimated scanned beam of ions, for example H+, is directed along a final beam path which is at an angle of at least 45° to the axis of rotation of the scan wheel. Ions are extracted from a source and accelerated along a linear acceleration path to a high implant energy (more than 500 keV) before scanning or mass analysis. The mass analyzer may be located near the axis of rotation and unwanted ions are directed to an annular beam dump which may be mounted on the scan wheel.

Abstract: Ion implant apparatus using a drum-type scan wheel holds wafers with a total cone angle less than 60°. A collimated scanned beam of ions, for example H+, is directed along a final beam path which is at an angle of at least 45° to the axis of rotation of the scan wheel. Ions are extracted from a source and accelerated along a linear acceleration path to a high implant energy (more than 500 keV) before scanning or mass analysis. The mass analyzer may be located near the axis of rotation and unwanted ions are directed to an annular beam dump which may be mounted on the scan wheel.

Abstract: Ion implant apparatus using a drum-type scan wheel holds wafers with a total cone angle less than 60°. A collimated scanned beam of ions, for example H+, is directed along a final beam path which is at an angle of at least 45° to the axis of rotation of the scan wheel. Ions are extracted from a source and accelerated along a linear acceleration path to a high implant energy (more than 500 keV) before scanning or mass analysis. The mass analyzer may be located near the axis of rotation and unwanted ions are directed to an annular beam dump which may be mounted on the scan wheel.

Abstract: A d.c. charged particle accelerator comprises accelerator electrodes separated by insulating spacers defining acceleration gaps between adjacent pairs of electrodes. Individually regulated gap voltages are applied across each adjacent pair of accelerator electrodes. In embodiments, the individually regulated gap voltages are generated by electrically isolated alternators mounted on a common rotor shaft driven by an electric motor. Alternating power outputs from the alternators provide inputs to individual regulated d.c. power supplies to generate the gap voltages. The power supplies are electrically isolated and have outputs connected in series across successive pairs of accelerator electrodes. The described embodiment enables an ion beam to be accelerated to high energies and high beam currents, with good accelerator stability.

Abstract: Ion implant apparatus using a drum-type scan wheel holds wafers with a total cone angle less than 60°. A collimated scanned beam of ions, for example H+, is directed along a final beam path which is at an angle of at least 45° to the axis of rotation of the scan wheel. Ions are extracted from a source and accelerated along a linear acceleration path to a high implant energy (more than 500 keV) before scanning or mass analysis. The mass analyzer may be located near the axis of rotation and unwanted ions are directed to an annular beam dump which may be mounted on the scan wheel.

Abstract: An apparatus and a method of ion implantation using a rotary scan assembly having an axis of rotation and a periphery. A plurality of substrate holders is distributed about the periphery, and the substrate holders are arranged to hold respective planar substrates. Each planar substrate has a respective geometric center on the periphery. A beam line assembly provides a beam of ions for implantation in the planar substrates on the holders. The beam line assembly is arranged to direct said beam along a final beam path.

Abstract: An apparatus and a method of ion implantation using a rotary scan assembly having an axis of rotation and a periphery. A plurality of substrate holders is distributed about the periphery, and the substrate holders are arranged to hold respective planar substrates. Each planar substrate has a respective geometric center on the periphery. A beam line assembly provides a beam of ions for implantation in the planar substrates on the holders. The beam line assembly is arranged to direct said beam along a final beam path.

Abstract: Multiple control electrodes are provided asymmetrically within the plasma chamber of an ion source at respective positions along the length of the plasma chamber. Biasing the control electrodes selectively can selectively enhance the ion extraction current at adjacent positions along the length of the extraction slit. A method of generating an ion beam is disclosed in which the strengths of the transverse electric fields at different locations along the length of the plasma chamber are controlled to modify the ion beam linear current density profile along the length of the slit. The method is used for controlling the uniformity of a ribbon beam.

Abstract: A d. c. charged particle accelerator comprises accelerator electrodes separated by insulating spacers defining acceleration gaps between adjacent pairs of electrodes. Individually regulated gap voltages are applied across each adjacent pair of accelerator electrodes. In embodiments, the individually regulated gap voltages are generated by electrically isolated alternators mounted on a common rotor shaft driven by an electric motor. Alternating power outputs from the alternators provide inputs to individual regulated d. c. power supplies to generate the gap voltages. The power supplies are electrically isolated and have outputs connected in series across successive pairs of accelerator electrodes. The described embodiment enables an ion beam to be accelerated to high energies and high beam currents, with good accelerator stability.

Abstract: Multiple control electrodes are provided asymmetrically within the plasma chamber of an ion source at respective positions along the length of the plasma chamber. Biasing the control electrodes selectively can selectively enhance the ion extraction current at adjacent positions along the length of the extraction slit. A method of generating an ion beam is disclosed in which the strengths of the transverse electric fields at different locations along the length of the plasma chamber are controlled to modify the ion beam linear current density profile along the length of the slit. The method is used for controlling the uniformity of a ribbon beam.

Abstract: An ion beam angle calibration and emittance measurement system, comprising a plate comprising an elongated slit therein, wherein the elongated slit positioned at a rotation center of the plate and configured to allow a first beam portion to pass therethrough. A beam current detector located downstream of the plate, wherein the beam current detector comprises a slit therein configured to permit a second beam portion of the first beam portion to pass therethrough, wherein the beam current detector is configured to measure a first beam current associated with the first beam portion. A beam angle detector is located downstream of the beam current detector and configured to detect a second beam current associated with the second beam portion. The plate, the current beam detector and the beam angle detector are configured to collectively rotate about the rotation center of the plate.