Patents by Inventor Ronald I. Holland, Jr.

Ronald I. Holland, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Crack monitoring apparatus
    Patent number: 5673203
    Abstract: An apparatus for monitoring the growth of surface cracks in materials includes a means for applying a load to a specimen to simulate actual use of the specimen, means for illuminating the specimen, means for capturing images of the specimen, and means for processing the images to monitor crack growth in the specimen. Optionally, the means for processing can be used to control the other means.
    Type: Grant
    Filed: March 28, 1996
    Date of Patent: September 30, 1997
    Assignee: United Technologies Corporation
    Inventors: Balkrishna S. Annigeri, Leroy H. Favrow, Robert J. Haas, Michael Winter, Ronald I. Holland, Jr., Jason S. Wegge, David M. Sanford
  • Crack monitoring apparatus
    Patent number: 5539656
    Abstract: An apparatus for monitoring the growth of surface cracks in materials includes a means for applying a load to a specimen to simulate actual use of the specimen, means for illuminating the specimen, means for capturing images of the specimen, and means for processing the images to monitor crack growth in the specimen. Optionally, the means for processing can be used to control the other means.
    Type: Grant
    Filed: October 11, 1994
    Date of Patent: July 23, 1996
    Assignee: United Technologies Corporation
    Inventors: Balkrishna S. Annigeri, Leroy H. Favrow, Robert J. Haas, Michael Winter, Ronald I. Holland, Jr., Jason S. Wegge, David M. Sanford