Abstract: An integrated circuit package includes a thermally and electrically conductive package lid. The package lid may be in electrical communication with an electrically conductive pad connected to a power plane, ground plane, or signal route in the integrated circuit. The electrically conductive package lid may provide an electrical connection for electrical power or electrical signals or may serve as an electrical ground. In some embodiments, the package lid may include a thermally and electrically conductive material. In other embodiments, the package lid may include an electrically insulative substrate coated on at least one surface with a layer of metal or another conductive material. The conductive layer may be electrically connected to electrical ground, a reference voltage, or a signal pay by at least one electrically conductive via.

Abstract: An integrated circuit package base includes a plurality of tiers. In some examples, an integrated circuit package encloses a plurality of stacked integrated circuits that are each electrically coupled to an electrical contact located on a respective tier of the package base. The tiers of the integrated circuit package can have different elevations relative to a bottom surface of the integrated circuit package.

Abstract: An integrated circuit package base includes a plurality of tiers. In some examples, an integrated circuit package encloses a plurality of stacked integrated circuits that are each electrically coupled to an electrical contact located on a respective tier of the package base. The tiers of the integrated circuit package can have different elevations relative to a bottom surface of the integrated circuit package.

Abstract: A hypersensitive semiconductor die structure is disclosed, in which flip-chip packaging is used in conjunction with a modified SOI die in which a thick silicon support substrate has been removed to increase sensitivity of the sensing device. Rather than being located beneath layers of interconnects and dielectric, the disclosed structure places the sensing devices close to the surface, more closely exposed to the environment in which sensing is to occur. The structure also allows for the placement of sensing films on nearer to the sensing devices and/or an oxide layer overlying the sensing devices.

Abstract: An integrated circuit package includes a thermally and electrically conductive package lid. The package lid may be in electrical communication with an electrically conductive pad connected to a power plane, ground plane, or signal route in the integrated circuit. The electrically conductive package lid may provide an electrical connection for electrical power or electrical signals or may serve as an electrical ground. In some embodiments, the package lid may include a thermally and electrically conductive material. In other embodiments, the package lid may include an electrically insulative substrate coated on at least one surface with a layer of metal or another conductive material. The conductive layer may be electrically connected to electrical ground, a reference voltage, or a signal pay by at least one electrically conductive via.

Abstract: A hypersensitive semiconductor die structure is disclosed, in which flip-chip packaging is used in conjunction with a modified SOI die in which a thick silicon support substrate has been removed to increase sensitivity of the sensing device. Rather than being located beneath layers of interconnects and dielectric, the disclosed structure places the sensing devices close to the surface, more closely exposed to the environment in which sensing is to occur. The structure also allows for the placement of sensing films on nearer to the sensing devices and/or an oxide layer overlying the sensing devices.