Patents by Inventor Ronald Johannes Hultermans

Ronald Johannes Hultermans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10990015
    Abstract: A debris mitigation system for use in a radiation source. The debris mitigation system comprises a contamination trap. The contamination trap comprises a debris receiving surface arranged to receive liquid metal fuel debris emitted from a plasma formation region of the radiation source. The debris receiving surface is constructed from a material that reacts with the liquid metal fuel debris to form an intermetallic layer on the debris receiving surface.
    Type: Grant
    Filed: June 22, 2017
    Date of Patent: April 27, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Michel Riepen, Paul Peter Anna Antonius Brom, Ronald Johannes Hultermans
  • Patent number: 10750604
    Abstract: An EUV source for generating a beam of EUV radiation, has a droplet generator with a nozzle assembly to emit droplets of fuel from a nozzle towards a plasma formation location. The nozzle assembly receives the fuel from a reservoir. The nozzle assembly has a pump chamber receiving the fuel from the reservoir and an actuator to vibrate a membrane that forms a wall of the pump chamber. The wall is oriented perpendicularly to a direction wherein the nozzle emits the fuel. The nozzle assembly has first and second nozzle filters non-adjacently arranged in series in a path of the fuel from the pump chamber to the nozzle.
    Type: Grant
    Filed: November 22, 2016
    Date of Patent: August 18, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Johan Frederik Dijksman, Wilhelmus Henricus Theodorus Maria Aangenent, Ronald Johannes Hultermans, Bastiaan Lambertus Wilhelmus Marinus Van De Ven, Peter Wilhelm Hendrik Van Putten
  • Publication number: 20190265594
    Abstract: A debris mitigation system for use in a radiation source. The debris mitigation system comprises a contamination trap. The contamination trap comprises a debris receiving surface arranged to receive liquid metal fuel debris emitted from a plasma formation region of the radiation source. The debris receiving surface is constructed from a material that reacts with the liquid metal fuel debris to form an intermetallic layer on the debris receiving surface.
    Type: Application
    Filed: June 22, 2017
    Publication date: August 29, 2019
    Applicant: ASML Netherlands B.V.
    Inventors: Michel RIEPEN, Paul BROM, Ronald Johannes HULTERMANS
  • Publication number: 20180368241
    Abstract: An EUV source for generating a beam of EUV radiation, has a droplet generator with a nozzle assembly to emit droplets of fuel from a nozzle towards a plasma formation location. The nozzle assembly receives the fuel from a reservoir. The nozzle assembly has a pump chamber receiving the fuel from the reservoir and an actuator to vibrate a membrane that forms a wall of the pump chamber. The wall is oriented perpendicularly to a direction wherein the nozzle emits the fuel. The nozzle assembly has first and second nozzle filters non-adjacently arranged in series in a path of the fuel from the pump chamber to the nozzle.
    Type: Application
    Filed: November 22, 2016
    Publication date: December 20, 2018
    Inventors: Johan Frederik DIJKSMAN, Wilhelmus Henricus Theodorus Maria AANGENENT, Ronald Johannes HULTERMANS, Bastiaan Lambertus Wilhelmus Marinus VAN DE VEN, Peter Wilhelm Hendrik VAN PUTTEN
  • Patent number: 9964852
    Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
    Type: Grant
    Filed: November 3, 2017
    Date of Patent: May 8, 2018
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Niek Antonius Jacobus Maria Kleemans, Denis Alexandrovich Glushkov, Ronald Johannes Hultermans, Benedictus Mathijs Renkens, Gerardus Hubertus Petrus Maria Swinkels, Christiaan Johannes Petrus Verspeek
  • Publication number: 20180120711
    Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
    Type: Application
    Filed: November 3, 2017
    Publication date: May 3, 2018
    Inventors: Niek Antonius Jacobus Maria KLEEMANS, Denis Alexandrovich GLUSHKOV, Ronald Johannes HULTERMANS, Benedictus Mathijs RENKENS, Gerardus Hubertus Petrus Maria SWINKELS, Christiaan Johannes Petrus VERSPEEK
  • Patent number: 9841680
    Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: December 12, 2017
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Niek Antonius Jacobus Maria Kleemans, Denis Alexandrovich Glushkov, Ronald Johannes Hultermans, Benedictus Mathijs Renkens, Gerardus Hubertus Petrus Maria Swinkels, Christiaan Johannes Petrus Verspeek
  • Patent number: 9715174
    Abstract: A droplet generator, for an EUV radiation source, comprises: a capillary in which, in use, molten material flows; an actuator configured to modulate a pressure inside the capillary; and a controller configured to drive the actuator at a driving frequency; wherein the droplet generator is arranged such that, in use, the driving frequency is equal or about equal to a main resonance frequency of the molten material in the capillary.
    Type: Grant
    Filed: October 30, 2013
    Date of Patent: July 25, 2017
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Johan Frederik Dijksman, Ramin Badie, Ronald Johannes Hultermans, Dzmitry Labetski
  • Patent number: 9462667
    Abstract: The present invention provides methods and apparatus for facilitating the start up of a fuel droplet stream generator. During a start-up phase the fuel droplet stream generator is positioned so that the fuel droplets re emitted downwardly whereby gravity assists in the establishment of the stream. The droplets are monitored using a visualization system and once the stream is determined to have the desired characteristics the stream generator is moved to a second position of steady state use in which the droplet stream is emitted in a horizontal direction.
    Type: Grant
    Filed: January 3, 2013
    Date of Patent: October 4, 2016
    Assignee: ASML Netherlands B.V.
    Inventors: Johan Frederik Dijksman, Ronald Johannes Hultermans, Antonius Theodorus Wilhelmus Kempen, Ramin Badie
  • Publication number: 20160054663
    Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
    Type: Application
    Filed: March 5, 2014
    Publication date: February 25, 2016
    Inventors: Niek Antonius Jacobus Maria KLEEMANS, Denis Alexandrovich GLUSHKOV, Ronald Johannes HULTERMANS, Benedictus Mathijs RENKENS, Gerardus Hubertus Petrus Maria SWINKELS, Christiaan Johannes Petrus VERSPEEK
  • Publication number: 20150293456
    Abstract: A droplet generator, for an EUV radiation source, comprises: a capillary in which, in use, molten material flows; an actuator configured to modulate a pressure inside the capillary; and a controller configured to drive the actuator at a driving frequency; wherein the droplet generator is arranged such that, in use, the driving frequency is equal or about equal to a main resonance frequency of the molten material in the capillary.
    Type: Application
    Filed: October 30, 2013
    Publication date: October 15, 2015
    Applicant: ASML Netherlands B.V.
    Inventors: Johan Frederik Dijksman, Ramin Badie, Ronald Johannes Hultermans, Dzmitry Labetski
  • Patent number: 8890099
    Abstract: A radiation source for generating EUV from a stream of molten metal fuel droplets by LPP (Laser Produced Plasma) or (Dual Laser Plasma) has a fuel droplet generator arranged to provide a stream of droplets of fuel and at least one laser configured to vaporise at least some of said droplets of fuel, whereby radiation is generated. The fuel droplet generator has nozzle, fuel supply line, and reservoir, with a pumping device arranged to supply a flow of molten metal fuel from the reservoir through the fuel feed line and out of the nozzle as a stream of droplets. The fuel droplet generator has a replaceable filter assembly in the fuel feed line, arranged to filter the molten metal fuel in use, to deter nozzle blockage by solid particulate impurities in the fuel.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: November 18, 2014
    Assignee: ASML Netherlands B.V.
    Inventors: Ronald Johannes Hultermans, Antonius Theodorus Wilhelmus Kempen, Bernard Van Essen
  • Publication number: 20140209817
    Abstract: A radiation source for generating EUV from a stream of molten metal fuel droplets by LPP (Laser Produced Plasma) or (Dual Laser Plasma) has a fuel droplet generator arranged to provide a stream of droplets of fuel and at least one laser configured to vaporise at least some of said droplets of fuel, whereby radiation is generated. The fuel droplet generator has nozzle, fuel supply line, and reservoir, with a pumping device arranged to supply a flow of molten metal fuel from the reservoir through the fuel feed line and out of the nozzle as a stream of droplets. The fuel droplet generator has a replaceable filter assembly in the fuel feed line, arranged to filter the molten metal fuel in use, to deter nozzle blockage by solid particulate impurities in the fuel.
    Type: Application
    Filed: July 27, 2012
    Publication date: July 31, 2014
    Applicant: ASML Netherlands B.V.
    Inventors: Ronald Johannes Hultermans, Antonius Theodorus Wilhelmus Kempen, Bernard Van Essen
  • Publication number: 20100315610
    Abstract: An immersion lithographic apparatus is disclosed having comprising a pump and buffer volume configured to remove remaining liquid from a substrate, the pump and the buffer volume configured to generate a vacuum cleaning gas flow near the substrate by gas suction into the buffer volume. In an embodiment, since gas flow is needed only a limited amount of time (ordinarily less than 5%), evacuation may be performed using only a moderately powered vacuum pump. In addition or alternatively, the buffer volume may be used as a backup volume buffer configured to provide gas vacuum suction, e.g., in case of a vacuum supply outage.
    Type: Application
    Filed: June 22, 2010
    Publication date: December 16, 2010
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Ronald Johannes Hultermans, Ton De Groot, Jacobus Johannus Leonardus Hendricus Verspay, Gerardus Everadus Marie Hannen
  • Patent number: 7764356
    Abstract: An immersion lithographic apparatus is disclosed having comprising a pump and buffer volume configured to remove remaining liquid from a substrate, the pump and the buffer volume configured to generate a vacuum cleaning gas flow near the substrate by gas suction into the buffer volume. In an embodiment, since gas flow is needed only a limited amount of time (ordinarily less than 5%), evacuation may be performed using only a moderately powered vacuum pump. In addition or alternatively, the buffer volume may be used as a backup volume buffer configured to provide gas vacuum suction, e.g., in case of a vacuum supply outage.
    Type: Grant
    Filed: September 26, 2008
    Date of Patent: July 27, 2010
    Assignee: ASML Netherlands B.V.
    Inventors: Ronald Johannes Hultermans, Ton De Groot, Jacobus Johannus Leonardus Hendricus Verspay, Gerardus Everardus Marie Hannen
  • Publication number: 20090033891
    Abstract: An immersion lithographic apparatus is disclosed having comprising a pump and buffer volume configured to remove remaining liquid from a substrate, the pump and the buffer volume configured to generate a vacuum cleaning gas flow near the substrate by gas suction into the buffer volume. In an embodiment, since gas flow is needed only a limited amount of time (ordinarily less than 5%), evacuation may be performed using only a moderately powered vacuum pump. In addition or alternatively, the buffer volume may be used as a backup volume buffer configured to provide gas vacuum suction, e.g., in case of a vacuum supply outage.
    Type: Application
    Filed: September 26, 2008
    Publication date: February 5, 2009
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Ronald Johannes Hultermans, Ton DE Groot, Jacobus Johannus Leonardus Hendricus Verspay, Gerardus Everardus Marie Hannen
  • Patent number: 7446850
    Abstract: An immersion lithographic apparatus is disclosed having comprising a pump and buffer volume configured to remove remaining liquid from a substrate, the pump and the buffer volume configured to generate a vacuum cleaning gas flow near the substrate by gas suction into the buffer volume. In an embodiment, since gas flow is needed only a limited amount of time (ordinarily less than 5%), evacuation may be performed using only a moderately powered vacuum pump. In addition or alternatively, the buffer volume may be used as a backup volume buffer configured to provide gas vacuum suction, e.g., in case of a vacuum supply outage.
    Type: Grant
    Filed: December 3, 2004
    Date of Patent: November 4, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Ronald Johannes Hultermans, Ton De Groot, Jacobus Johannus Leonardus Hendricus Verspay, Gerardus Everardus Marie Hannen
  • Patent number: 7136142
    Abstract: A lithographic apparatus is disclosed. The apparatus includes an illumination system to provide a beam of radiation, and a support structure for supporting a patterning device. The patterning device serves to impart the beam with a pattern in its cross-section. The apparatus also includes a gas flushing device for flushing a substantially laminar flow of gas across the beam of radiation and/or along a surface of an optical component. The gas flushing device includes a single gas outlet that has an inner rim at a downstream end of the gas outlet. The inner rim defines a total gas outlet area. The gas outlet is provided with a laminator that has an effective area out of which, in use, the substantially laminar flow of gas flows. The laminator effective area includes material that has laminator openings and is at least as large as the total gas outlet area.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: November 14, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Marcel Beckers, Ronald Johannes Hultermans, Nicolaas Ten Kate, Nicolaas Rudolf Kemper, Nicolaas Franciscus Koppelaars, Jan-Marius Schotsman, Ronald Van Der Ham, Johannes Antonius Maria Martina Van Uijtregt
  • Patent number: 7106412
    Abstract: A lithographic projection apparatus includes a radiation system constructed and arranged to supply a projection beam of radiation, a support structure constructed and arranged to support a patterning structure, the patterning structure constructed and arranged to pattern the projection beam according to a desired pattern, a substrate support constructed and arranged to support a substrate, and a projection system constructed and arranged to project the patterned beam onto a target portion of the substrate. The apparatus further includes a gas flushing system comprising radial gas flow outlets, said gas flushing system being constructed and arranged to generate a radial gas flow through said radial gas flow outlets in an intermediate space defined between said gas flushing system and said substrate, wherein the radial gas flow has a radial velocity directed outwards in said space with a magnitude larger than zero at every location in said space.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: September 12, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Pieter Klaas De Bokx, Tjarko Adriaan Rudolf Van Empel, Ronald Johannes Hultermans, Adrianus Cornelius Antonius Jonkers
  • Publication number: 20040212791
    Abstract: A lithographic projection apparatus includes a radiation system constructed and arranged to supply a projection beam of radiation, a support structure constructed and arranged to support a patterning structure, the patterning structure constructed and arranged to pattern the projection beam according to a desired pattern, a substrate support constructed and arranged to support a substrate, and a projection system constructed and arranged to project the patterned beam onto a target portion of the substrate. The apparatus further includes a gas flushing system comprising radial gas flow outlets, said gas flushing system being constructed and arranged to generate a radial gas flow through said radial gas flow outlets in an intermediate space defined between said gas flushing system and said substrate, wherein the radial gas flow has a radial velocity directed outwards in said space with a magnitude larger than zero at every location in said space.
    Type: Application
    Filed: February 12, 2004
    Publication date: October 28, 2004
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Pieter Klaas De Bokx, Tjarko Adriaan Rudolf Van Empel, Ronald Johannes Hultermans, Adrianus Cornelius Antonius Jonkers