Abstract: A test pad is formed outside an array of pads included in connection structures such as pin mounting pads to which connection pins may be brazed in, for example, bottom side metallurgy of a multi-layer modular electronic package. In-line voltage plane testing may then be accomplished through temporary connections to the test pads for any desired layer, such as top side metallurgy distribution layers, while protecting the pin-mounting pads from physical and/or chemical damage or contamination during manufacturing processes for addition of layers to the electrical interconnection structure of the multi-layer module.

Abstract: Missing thin film metallurgy on substrates is replaced during the manufacture of thin film electronic circuits. The process allows the missing thin film metallurgy, such as an input/output (I/O) pad or pads, to be replaced quickly and simply, without damaging the other I/O pads or thin film metallurgy already applied to the substrate. The process essentially uses lift-off technology without building a complete lift-off stencil.