Patents by Inventor Ronald T. Bertram

Ronald T. Bertram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100000681
    Abstract: A method of and apparatus for regulating carbon dioxide using a pre-injection assembly coupled to a processing chamber operating at a supercritical state is disclosed. The method and apparatus utilize a source for providing supercritical carbon dioxide to the pre-injection assembly and a temperature control element for maintaining the pre-injection region at a supercritical temperature and pressure.
    Type: Application
    Filed: July 29, 2009
    Publication date: January 7, 2010
    Applicant: SUPERCRITICAL SYSTEMS, INC.
    Inventors: Ronald T. Bertram, Joseph T Hillman, Maximilian A Biberger
  • Patent number: 6121140
    Abstract: A method of producing a thick metal film on a substrate surface with a substantially smooth surface morphology and low resistivity. A substrate is exposed to a plasma. A first thin metal film is deposited on the substrate by chemical vapor deposition. The substrate with the film deposited thereon is exposed to a plasma, and a second thin metal film is deposited on top of the first film. The substrate may undergo subsequent cycles of plasma exposure and film deposition until a desired film thickness is obtained. The resulting film has a smooth surface morphology and low resistivity.
    Type: Grant
    Filed: October 9, 1997
    Date of Patent: September 19, 2000
    Assignee: Tokyo Electron Limited
    Inventors: Chantal Arena, Ronald T. Bertram, Emmanuel Guidotti, Joseph T. Hillman
  • Patent number: 6090705
    Abstract: A method of eliminating an edge effect in chemical vapor deposition of a metal such as copper on a semiconductor substrate surface. A susceptor in a reaction chamber is exposed to a plasma. A substrate contained thereon and processed by chemical vapor deposition has a uniform metal layer at edge and non-edge surfaces. A plurality of substrates may be processed before reexposing the susceptor to the plasma.
    Type: Grant
    Filed: January 20, 1998
    Date of Patent: July 18, 2000
    Assignee: Tokyo Electron Limited
    Inventors: Chantal Arena, Ronald T. Bertram, Emmanuel Guidotti, Joseph T. Hillman