Abstract: A VLSI chip tester for defining and performing functional tests, delay tests, and DC parametric tests on VLSI chips. The VLSI chip under test is mounted to a paddle card which, in turn, is detachably held under pressure against a circuit board mounted in a test fixture. A connector is sandwiched between the paddle card and circuit board. The connector has insulated, spaced-apart conductors that are orthogonal to the paddle card and circuit board, and that provide electrical contact between each pin of the VLSI chip under test and a corresponding pad on the circuit board. Shift register circuits mounted to the circuit board provide a single stage corresponding to each I/O pin of the device under test. Each stage may function as an input or output device. A computer or computers are coupled to the shift register circuits through appropriate cabling and driver/receiver/termination circuits. Test data to be sent to or from the computer may be shifted serially into or out of the shift register circuits.