Patents by Inventor Ronald Tanizawa

Ronald Tanizawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4504783
    Abstract: A VLSI chip tester for defining and performing functional tests, delay tests, and DC parametric tests on VLSI chips. The VLSI chip under test is mounted to a paddle card which, in turn, is detachably held under pressure against a circuit board mounted in a test fixture. A connector is sandwiched between the paddle card and circuit board. The connector has insulated, spaced-apart conductors that are orthogonal to the paddle card and circuit board, and that provide electrical contact between each pin of the VLSI chip under test and a corresponding pad on the circuit board. Shift register circuits mounted to the circuit board provide a single stage corresponding to each I/O pin of the device under test. Each stage may function as an input or output device. A computer or computers are coupled to the shift register circuits through appropriate cabling and driver/receiver/termination circuits. Test data to be sent to or from the computer may be shifted serially into or out of the shift register circuits.
    Type: Grant
    Filed: September 30, 1982
    Date of Patent: March 12, 1985
    Assignee: STORAGE Technology Partners
    Inventors: John Zasio, Dwight Elvey, Ronald Tanizawa