Patents by Inventor Ronald W. ADKINS
Ronald W. ADKINS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11231345Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.Type: GrantFiled: May 23, 2019Date of Patent: January 25, 2022Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
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Publication number: 20190346345Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.Type: ApplicationFiled: May 23, 2019Publication date: November 14, 2019Inventors: Giovanni SCIALO, Ronald W. ADKINS, Davide RECCHIA
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Patent number: 10345200Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.Type: GrantFiled: July 23, 2014Date of Patent: July 9, 2019Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
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Patent number: 9808760Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: GrantFiled: June 6, 2017Date of Patent: November 7, 2017Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
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Patent number: 9810558Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.Type: GrantFiled: March 12, 2015Date of Patent: November 7, 2017Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Thomas Bates, Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
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Publication number: 20170266614Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: ApplicationFiled: June 6, 2017Publication date: September 21, 2017Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
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Patent number: 9682345Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: GrantFiled: July 7, 2015Date of Patent: June 20, 2017Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
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Patent number: 9631222Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.Type: GrantFiled: March 12, 2015Date of Patent: April 25, 2017Assignee: Particle Measuring Systems, Inc.Inventors: Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
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Publication number: 20160008757Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: ApplicationFiled: July 7, 2015Publication date: January 14, 2016Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
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Publication number: 20160002700Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.Type: ApplicationFiled: March 12, 2015Publication date: January 7, 2016Applicant: Particle Measuring Systems, Inc.Inventors: Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
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Publication number: 20150355000Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.Type: ApplicationFiled: March 12, 2015Publication date: December 10, 2015Applicant: Particle Measuring Systems, IncInventors: Thomas BATES, Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
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Publication number: 20150075301Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.Type: ApplicationFiled: July 23, 2014Publication date: March 19, 2015Inventors: Giovanni SCIALO, Ronald W. ADKINS, Davide RECCHIA