Patents by Inventor Ronald W. ADKINS

Ronald W. ADKINS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11231345
    Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: January 25, 2022
    Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
  • Publication number: 20190346345
    Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.
    Type: Application
    Filed: May 23, 2019
    Publication date: November 14, 2019
    Inventors: Giovanni SCIALO, Ronald W. ADKINS, Davide RECCHIA
  • Patent number: 10345200
    Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.
    Type: Grant
    Filed: July 23, 2014
    Date of Patent: July 9, 2019
    Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
  • Patent number: 9808760
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: June 6, 2017
    Date of Patent: November 7, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Patent number: 9810558
    Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: November 7, 2017
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Thomas Bates, Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
  • Publication number: 20170266614
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Application
    Filed: June 6, 2017
    Publication date: September 21, 2017
    Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
  • Patent number: 9682345
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: June 20, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Patent number: 9631222
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: April 25, 2017
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
  • Publication number: 20160008757
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Application
    Filed: July 7, 2015
    Publication date: January 14, 2016
    Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
  • Publication number: 20160002700
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Application
    Filed: March 12, 2015
    Publication date: January 7, 2016
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Publication number: 20150355000
    Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.
    Type: Application
    Filed: March 12, 2015
    Publication date: December 10, 2015
    Applicant: Particle Measuring Systems, Inc
    Inventors: Thomas BATES, Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Publication number: 20150075301
    Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.
    Type: Application
    Filed: July 23, 2014
    Publication date: March 19, 2015
    Inventors: Giovanni SCIALO, Ronald W. ADKINS, Davide RECCHIA