Abstract: A Kelvin probe system is described for measuring resistance between two locations on an electrical device, by the use of two probe assemblies that each includes two wires, wherein each probe assembly is of simplified construction, easier to use, and more reliable. Each probe assembly (110, 112) includes a single point probe tip (12) with a pointed proximal end (102) for engaging a device contact and with a distal end (106). A cable (110) with voltage and current conductors (114, 116) has distal ends (120, 122) connected to contacts of a connector, and proximal ends (130, 132) each connected to the distal end of the probe tip. Although a large current passes through the current conductor (116) and through the length of the probe tip, the resistance-caused voltage drop across the probe tip is very small and therefore does not significantly affect accuracy of a resistance measurement.