Patents by Inventor Ronen-Pavel Urenski

Ronen-Pavel Urenski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tailoring domain engineered structures in ferroelectric materials
    Patent number: 7151257
    Abstract: Scanning probe apparatus, comprising: a) a tip-electrode which is coupled to be maintained at a first potential; b) a counter-electrode which is positioned in proximity with the tip electrode and which is coupled to be maintained at a second potential differing from the first potential by a value greater than approximately 150 volts; and c) positioning instrumentation, which is adapted to maintain the tip-electrode at a distance from a surface while scanning the tip-electrode parallel to the surface, and controls the position of the tip-electrode in a scanning direction parallel to the surface to within a resolution sufficient so that the apparatus can be used as a scanning probe microscope.
    Type: Grant
    Filed: June 1, 2004
    Date of Patent: December 19, 2006
    Assignee: Ramot at Tel-Aviv University Ltd.
    Inventors: Gil Rosenman, Yossi Rosenwaks, Ronen-Pavel Urenski
  • Tailoring domain engineered structures in ferroelectric materials
    Publication number: 20050023462
    Abstract: Scanning probe apparatus, comprising: a) a tip-electrode which is coupled to be maintained at a first potential; b) a counter-electrode which is positioned in proximity with the tip electrode and which is coupled to be maintained at a second potential differing from the first potential by a value greater than approximately 150 volts; and c) positioning instrumentation, which is adapted to maintain the tip-electrode at a distance from a surface while scanning the tip-electrode parallel to the surface, and controls the position of the tip-electrode in a scanning direction parallel to the surface to within a resolution sufficient so that the apparatus can be used as a scanning probe microscope.
    Type: Application
    Filed: June 1, 2004
    Publication date: February 3, 2005
    Applicant: Ramot at Tel-Aviv University Ltd.
    Inventors: Gil Rosenman, Yossi Rosenwaks, Ronen-Pavel Urenski
  • Tailoring domain engineered structures in ferroelectric materials
    Patent number: 6653630
    Abstract: Scanning probe apparatus, including a tip-electrode which is coupled to be held at a substantially ground potential, a counter-electrode which is positioned in proximity to the tip-electrode, a voltage source, coupled to maintain the counter-electrode at a non-ground potential, and positioning-instrumentation, which is adapted to maintain the tip-electrode at a suitable position relative to a surface of a ferroelectric sample located in a space between the tip-electrode and the counter-electrode. The apparatus generates an electric field in the ferroelectric sample greater than a coercive field of the sample.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: November 25, 2003
    Assignee: Ramot - University Authority for Applied Research & Industrial Development Ltd.
    Inventors: Gil Rosenman, Yossi Rosenwaks, Ronen-Pavel Urenski