Abstract: A system and method for measurement of parameters of radio-frequency transmission devices is introduced. The system includes a digital signal processing (DSP) unit and RF transmitter and receiver modules. The transmitter generates Gaussian white noise and transmits it to the device under test (DUT) input. The output of the DUT is connected to the receiver. Using DSP analysis on the output response of the DUT to white noise, the DUT transfer function is estimated using iterative LMS method. From the estimated transfer function all the parameters which are used to describe the device can be calculated such as: gain, flatness, phase and group delay, phase and group delay variations, frequency response, filters rejection etc.

Abstract: A system and method for measurement of parameters of radio-frequency transmission devices is introduced. The system includes a digital signal processing (DSP) unit and RF transmitter and receiver modules. The transmitter generates Gaussian white noise and transmits it to the device under test (DUT) input. The output of the DUT is connected to the receiver. Using DSP analysis on the output response of the DUT to white noise, the DUT transfer function is estimated using iterative LMS method. From the estimated transfer function all the parameters which are used to describe the device can be calculated such as: gain, flatness, phase and group delay, phase and group delay variations, frequency response, filters rejection etc.