Abstract: Disclosed are a thickness detection device, method and system, a storage medium and a processor. The thickness detection device includes: a detection unit, including a plurality of thickness detection chips, wherein the thickness detection chips are sequentially arranged at least in a second direction; and a common unit, arranged opposite and spaced from the detection unit in a first direction, wherein distances between at least two positions of a first surface of the common unit and the detection unit are different, the second direction is perpendicular to the first direction and a moving direction of an object to be detected, and the first surface is a surface of the common unit which is close to the measurement unit.

Abstract: The present application provides a device for detecting a defect in a steel cord ply. The device is configured to obtain an enhanced magnetic field signal of the steel cord ply and detect a defect of the steel cord ply based on the enhanced magnetic field signal. The device includes a magnetic field unit including a permanent magnet configured to generate a background magnetic field; a signal obtaining unit configured to generate an enhanced magnetic field signal of a steel cord ply based on a plurality of first magnetic field signals and a plurality of second magnetic field signals; and a defect detecting unit configured to detect a defect of the steel cord ply based on the enhanced magnetic field signal, wherein the defect detecting unit includes an AD converting module, a signal processing module, a defect detecting module, a display module, and a control module.

Abstract: Provided are a method and an apparatus for detecting a thickness of paper, and a storage medium. The method includes: acquiring a first thickness image of a target paper; extracting at least one first thickness feature and at least one second thickness feature from the first thickness image in the first thickness image; performing average processing on gray values of multiple pixel points in the at least one first thickness feature to acquire a first gray value, and the average processing is performed on gray values of the multiple pixel points in the at least one second thickness feature to acquire a second gray value; when the first gray value is smaller than the second gray value of multiple pixel points in at least one second thickness feature, determining that a thickness of a region, corresponding to the at least one second thickness feature, on the target paper has changed.

Abstract: Disclosed are a thickness detection device, method and system, a storage medium and a processor. The thickness detection device includes: a detection unit, including a plurality of thickness detection chips, wherein the thickness detection chips are sequentially arranged at least in a second direction; and a common unit, arranged opposite and spaced from the detection unit in a first direction, wherein distances between at least two positions of a first surface of the common unit and the detection unit are different, the second direction is perpendicular to the first direction and a moving direction of an object to be detected, and the first surface is a surface of the common unit which is close to the measurement unit.

Abstract: Provided are a method and an apparatus for detecting a thickness of parer, and a storage medium. The method includes: acquiring a first thickness image of a target paper; extracting at least one first thickness feature and at least one second thickness feature from the first thickness image in the first thickness image; performing average processing on gray values of multiple pixel points in the at least one first thickness feature to acquire a first gray value, and the average processing is performed on gray values of the multiple pixel points in the at least one second thickness feature to acquire a second gray value, when the first gray value is, smaller than the second gray value of multiple pixel points in at least one second thickness feature, determining that a thickness of a region, corresponding to the at least one second thickness feature, on the target paper has changed.