Abstract: A transparent illumination system and related light guide plate is provided. The system is configured to facilitate total internal reflection propagation of light through the light guide plate despite low index of refraction differences between the glass material of the light guide layer and the adjacent layer. The system includes a light source, such as a laser diode, and an optical element to fan out light from the light source in the plane of the light guide plate. The light guide plate includes internal light extraction features.

Abstract: A transparent illumination system and related light guide plate is provided. The system is configured to facilitate total internal reflection propagation of light through the light guide plate despite low index of refraction differences between the glass material of the light guide layer and the adjacent layer. The system includes a light source, such as a laser diode, and an optical element to fan out light from the light source in the plane of the light guide plate. The light guide plate includes internal light extraction features.

Abstract: A method for processing a transparent workpiece includes forming a closed contour in the transparent workpiece. The closed contour includes a plurality of defects in the transparent workpiece and has a rectilinear shape. Forming the closed contour includes directing a pulsed laser beam through an aspheric optical element and into the transparent workpiece to generate an induced absorption within the transparent workpiece and produce a defect within the transparent workpiece. Forming the closed contour also includes translating the pulsed laser beam focal line along a closed contour line having the rectilinear shape, thereby laser forming the plurality of defects of the closed contour. In addition, the method for processing the transparent workpiece includes etching the transparent workpiece with a chemical etching solution to separate a portion of the transparent workpiece along the closed contour, thereby forming an aperture extending through the transparent workpiece.

Abstract: A process application layer receives a command that define a generic test for an application under test. A test code generator transforms the command into test engine instructions that exercise the generic tests on the application under test.

Abstract: A process application layer receives a command that define a generic test for an application under test. A test code generator transforms the command into test engine instructions that exercise the generic tests on the application under test.