Abstract: An optical inspection system, the system includes: (i) an image sensor; and (ii) a single optical element, that at least partially surrounds an edge of an inspected object; wherein the optical element is adapted to direct light from different areas of the edge of the inspected object towards the image sensor so that the image sensor concurrently obtains images of the different areas.

Abstract: A method, system and a computer program product for evaluating contact elements, the method includes: acquiring images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted during a test by the same group of probes so as to form multiple probe marks; and evaluating at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of a first contact element and a number of potential probe marks that appear in an image of a second contact element.

Abstract: A system and a method for method for printing a solder mask on a printed circuit board (PCB), the method includes: acquiring images of multiple areas of a PCB by an inspection unit while the PCB is supported by a mechanical stage; determining spatial differences between a model of the PCB and the PCB based on the images; determining solder mask ink deposition locations based on (i) the spatial differences, and (ii) locations of the model of the PCB that should be coated with the solder mask ink; and printing solder mask ink on the solder mask deposition locations by a printing unit, while the PCB is supported by the mechanical stage.

Abstract: A method and a system for preparing a pattern's reference-model to be used for automatic inspection of surface are disclosed. The system according to the present invention is comprised of an imaging device that captured images of plurality of the patters; a dedicated software that uses dedicated algorithms to correct and align the captured images; and a controller operative for collecting the same located and same coincident pixel of each of the images; choosing, according to predetermined criteria, one of the collected pixels; creating a new image with same dimensions as the captured images and locating the chosen pixel in the same place corresponding to the place of the collected pixels in the origin images; repeating the process as defined above for each pixel of the captured images; and providing the new created image as a reference model for inspecting the pattern.

Abstract: An optical inspection system, the system includes: (i) an image sensor; and (ii) a single optical element, that at least partially surrounds an edge of an inspected object; wherein the optical element is adapted to direct light from different areas of the edge of the inspected object towards the image sensor so that the image sensor concurrently obtains images of the different areas.

Abstract: A method, system and a computer program product for evaluating contact elements, the method includes: acquiring images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted during a test by the same group of probes so as to form multiple probe marks; and evaluating at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of a first contact element and a number of potential probe marks that appear in an image of a second contact element.

Abstract: A morphological inspection method based on a comparison of real images—a real reference image and a real inspected image of an inspected object is disclosed.

Abstract: A method for storing and displaying a layers' information of a layer-made object, comprising: (a) forming a layer-image of each layer of said object layers, wherein said layer image is a real perpendicular view image of said layer; (b) aligning each of said layer-images in a common two-dimensions axis, wherein said layer-image location in said common axis is in correspondence with the location of said layer in said object when is assembled; (c) forming two dimension matrixes, a two dimension matrix for each layer-image, wherein each matrix element has three variables (x,y,j)—when “x” and “y” are representing a point location on said layer-image according to said common axis and “j” represents an appearance of material view in said point of said layer-image; and (d) adding said two dimension matrixes into a three-dimensions matrix, wherein each matrix element has four variables (x,y,z,j)—when “x” and “y” are representing said point location, “z” represents layer identification and “j” represents said appearanc

Abstract: A morphological inspection method based on a comparison of real images—a real reference image and a real inspected image of an inspected object is disclosed.

Abstract: A method for storing and displaying a layers' information of a layer-made object, comprising: (a) forming a layer-image of each layer of said object layers, wherein said layer image is a real perpendicular view image of said layer; (b) aligning each of said layer-images in a common two-dimensions axis, wherein said layer-image location in said common axis is in correspondence with the location of said layer in said object when is assembled; (c) forming two dimension matrixes, a two dimension matrix for each layer-image, wherein each matrix element has three variables (x, y, j)—when “x” and “y” are representing a point location on said layer-image according to said common axis and “j” represents an appearance of material view in said point of said layer-image; and (d) adding said two dimension matrixes into a three-dimensions matrix, wherein each matrix element has four variables (x, y.