Abstract: A method is useable for correcting a spherical aberration of a microscope having an objective and a cover slip or object carrier, the objective having a correction element for correcting the spherical aberration. The method includes: ascertaining, by the microscope, an index of refraction of an optical medium bordering the cover slip or object carrier and/or a thickness of the cover slip or object carrier along an optical axis of the objective, ascertaining the spherical aberration based on the index of refraction of the optical medium and/or the thickness of the cover slip or object carrier, and ascertaining, based on the spherical aberration, a positioning variable, by which the correction element is adjusted so that the spherical aberration is corrected.

Abstract: A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.

Abstract: A method is useable for determining a refractive index of an optical medium in a microscope, which has an objective facing toward a sample chamber. The optical medium is one of two optical media, which border two opposing surfaces of a cover slip or object carrier in the sample chamber and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected at each of the interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering intensities by the position-sensitive detector; and determining the refractive index of the optical medium based on the registered intensities.

Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

Abstract: A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.

Abstract: A method is useable for determining a refractive index of an optical medium in a microscope, which has an objective facing toward a sample chamber. The optical medium is one of two optical media, which border two opposing surfaces of a cover slip or object carrier in the sample chamber and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected at each of the interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering intensities by the position-sensitive detector; and determining the refractive index of the optical medium based on the registered intensities.

Abstract: A method is useable for correcting a spherical aberration of a microscope having an objective and a cover slip or object carrier, the objective having a correction element for correcting the spherical aberration. The method includes: ascertaining, by the microscope, an index of refraction of an optical medium bordering the cover slip or object carrier and/or a thickness of the cover slip or object carrier along an optical axis of the objective, ascertaining the spherical aberration based on the index of refraction of the optical medium and/or the thickness of the cover slip or object carrier, and ascertaining, based on the spherical aberration, a positioning variable, by which the correction element is adjusted so that the spherical aberration is corrected.