Abstract: A quick-connect terminal and receptacle for electrical spring test probes used in the printed circuit testing industry has a tubular receptacle having an inner bore with an entrance for inserting a wire terminal. The terminal has an open end receiving a base end of a wire. A barb cut from the terminal wall extends angularly into the terminal bore and away from the open end. The barb has an edge for gripping the wire end and preventing easy pullout. The wire extends to circuit testers which execute a testing routine upon the printed circuit board. The receptacles contain removable and replaceable spring probes and the quick-connect terminal and receptacle assembly provides speed and ease of probe replacement. Sealing rings can extend between the terminal and receptacle to maintain vacuum for use of the arrangement in vacuum actuated test fixtures.