Patents by Inventor Roopal Amit Patel

Roopal Amit Patel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250138744
    Abstract: Systems, methods, and apparatus for a memory device having test mode state machines configured to perform self-testing. In one approach, a memory array has memory cells. Periphery logic of the memory device receives a command from a host device to initiate self-testing. The periphery logic generates trigger signal(s) in response to receiving the command. Control circuitry (e.g., a controller) has state machine(s) that receives the trigger signal(s) and initiates execution of a command sequence. The command sequence includes various orders of operations such as read, write, or delay. A state machine can be integrated into each of multiple partitions of the memory array.
    Type: Application
    Filed: December 27, 2024
    Publication date: May 1, 2025
    Inventors: Rucha Deepak Geedh, Manjinder Singh Bains, Roopal Amit Patel
  • Patent number: 12210766
    Abstract: Systems, methods, and apparatus for a memory device having test mode state machines configured to perform self-testing. In one approach, a memory array has memory cells. Periphery logic of the memory device receives a command from a host device to initiate self-testing. The periphery logic generates trigger signal(s) in response to receiving the command. Control circuitry (e.g., a controller) has state machine(s) that receives the trigger signal(s) and initiates execution of a command sequence. The command sequence includes various orders of operations such as read, write, or delay. A state machine can be integrated into each of multiple partitions of the memory array.
    Type: Grant
    Filed: June 1, 2022
    Date of Patent: January 28, 2025
    Assignee: Micron Technology, Inc.
    Inventors: Rucha Deepak Geedh, Manjinder Singh Bains, Roopal Amit Patel
  • Publication number: 20230393774
    Abstract: Systems, methods, and apparatus for a memory device having test mode state machines configured to perform self-testing. In one approach, a memory array has memory cells. Periphery logic of the memory device receives a command from a host device to initiate self-testing. The periphery logic generates trigger signal(s) in response to receiving the command. Control circuitry (e.g., a controller) has state machine(s) that receives the trigger signal(s) and initiates execution of a command sequence. The command sequence includes various orders of operations such as read, write, or delay. A state machine can be integrated into each of multiple partitions of the memory array.
    Type: Application
    Filed: June 1, 2022
    Publication date: December 7, 2023
    Inventors: Rucha Deepak Geedh, Manjinder Singh Bains, Roopal Amit Patel