Abstract: A projection system that facilitates the use of in-situ detection of a change in wavelength, thereby enabling appropriate compensation or corrections to be applied on the fly to improve the quality of the image in the primary image region. In-situ detection in this manner can allow wavelength changes due to both temperature fluctuations and hardware variations to be compensated for simultaneously, thereby reducing the time and expense for end of line hardware testing, and removing the need to perform in-situ mapping of the wavelength as a function of temperature. In this way, the quality of the image provided to a user can be improved in a simpler, more efficient manner.

Abstract: There is provided a display device comprising a substrate; a spatial light modulator and a sealing element. The spatial light modulator is mounted on the substrate and comprises a light modulating region and an electrical connection region adjacent to the light modulating region. The sealing element comprises a primary portion comprising a first material and a secondary portion comprising a second material. The primary portion of the sealing element extends around at least a portion of a perimeter of the light modulating region and the secondary portion of the sealing element extends over the electrical connection region. The first material has a first coefficient of thermal expansion that is greater than a second coefficient of thermal expansion of the second material.

Abstract: A projection system that facilitates the use of in-situ detection of a change in wavelength, thereby enabling appropriate compensation or corrections to be applied on the fly to improve the quality of the image in the primary image region. In-situ detection in this manner can allow wavelength changes due to both temperature fluctuations and hardware variations to be compensated for simultaneously, thereby reducing the time and expense for end of line hardware testing, and removing the need to perform in-situ mapping of the wavelength as a function of temperature. In this way, the quality of the image provided to a user can be improved in a simpler, more efficient manner.

Abstract: A projection system that facilitates the use of in-situ detection of a change in wavelength, thereby enabling appropriate compensation or corrections to be applied on the fly to improve the quality of the image in the primary image region. In-situ detection in this manner can allow wavelength changes due to both temperature fluctuations and hardware variations to be compensated for simultaneously, thereby reducing the time and expense for end of line hardware testing, and removing the need to perform in-situ mapping of the wavelength as a function of temperature. In this way, the quality of the image provided to a user can be improved in a simpler, more efficient manner.