Abstract: Disclosed here is a system which uses simulations of an electronic circuit and a classifier to create an optimized Test Program Set. A user provides a model of the circuit, including descriptions of common faults. Candidate test signals are simulated in the circuit, evaluated using a classifier and a fitness function which optimizes for fault detection and isolation, and evolved according to a genetic algorithm. The system records the best test signals and terminates after reaching a certain fitness, or after a certain time. The process generates necessary information for an optimized Test Program Set for a given Unit Under Test circuit. This allows test program sets to be generated for complex circuits in a largely automated manner.