Abstract: Systems and methods are disclosed for reduced-power serial data links. A clock-forwarded serial link carries a clock lane and one or more data lanes. Every active serial data cycle is accompanied by its own serial clock edge: a clock delay allows the same clock edge to drive data at a transmitter and latch data at a receiver. Power is saved by idling the serial clock when data is not being transmitted. A valid signal can be omitted, providing a space saving. At the destination, similar clock-forwarding and delay enables a single parallel clock edge to drive data to the boundary of its clock domain, e.g. from a deserializer to a FIFO. The data link exhibits zero-cycle entry and exit. Variations with half- or single-cycle entry or exit are disclosed.

Abstract: Multi-die systems with modular die-to-die link macros for enabling die-to-die communication are described. A multi-die system includes a first die comprising a first set of modular die-to-die (D2D) transmit link macros and a first set of modular D2D receive link macros. The multi-die system further includes a second die, coupled to the first die via die-to-die (D2D) links, comprising a second set of modular D2D transmit link macros and a second set of modular D2D receive link macros. Each of the transmit/receive macros has the same physical shape, size, and the bandwidth capacity. The modularity associated with respective modular D2D transmit link macros and respective modular D2D receive link macros allows different combinations of an amount of bandwidth for data being transmitted or received via the D2D links and different amounts of edge depths for the first die and the second die along the die edge.

Abstract: Disclosed is a system where indicators of the relative phase differences between combinations of clocks in a multi-phase clock system are developed and/or measured. These indicators convey information regarding which phase difference between a given pair of the clocks is greater than (or less than) the phase difference between another pair of the clocks. This information is used to sort/rank/order phase differences between the various combinations of pairs of clocks according to their phase differences. This ranking is used to select the pair of clocks to be adjusted.

Abstract: Disclosed is a system where indicators of the relative phase differences between combinations of clocks in a multi-phase clock system are developed and/or measured. These indicators convey information regarding which phase difference between a given pair of the clocks is greater than (or less than) the phase difference between another pair of the clocks. This information is used to sort/rank/order phase differences between the various combinations of pairs of clocks according to their phase differences. This ranking is used to select the pair of clocks to be adjusted.

Abstract: Disclosed is a system where indicators of the relative phase differences between combinations of clocks in a multi-phase clock system are developed and/or measured. These indicators convey information regarding which phase difference between a given pair of the clocks is greater than (or less than) the phase difference between another pair of the clocks. This information is used to sort/rank/order phase differences between the various combinations of pairs of clocks according to their phase differences. This ranking is used to select the pair of clocks to be adjusted.

Abstract: Disclosed is a system where indicators of the relative phase differences between combinations of clocks in a multi-phase clock system are developed and/or measured. These indicators convey information regarding which phase difference between a given pair of the clocks is greater than (or less than) the phase difference between another pair of the clocks. This information is used to sort/rank/order phase differences between the various combinations of pairs of clocks according to their phase differences. This ranking is used to select the pair of clocks to be adjusted.

Abstract: The embodiments herein describe technologies of an amplifier circuit that is designed for wideband communication with superconductive components in cryogenic applications, including Josephson Junction integrated circuits, operating in a cryogenic temperature domain (e.g., 4K). The amplifier circuit operates in a temperature domain (e.g., 77K) that is higher than the cryogenic temperature domain of the superconductive components.

Abstract: A receiver with clock phase calibration is disclosed. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: The embodiments herein describe technologies of an amplifier circuit that is designed for wideband communication with superconductive components in cryogenic applications, including Josephson Junction integrated circuits, operating in a cryogenic temperature domain (e.g., 4K). The amplifier circuit operates in a temperature domain (e.g., 77K) that is higher than the cryogenic temperature domain of the superconductive components.

Abstract: A receiver with clock phase calibration. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.

Abstract: A receiver with clock phase calibration. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.

Abstract: A receiver with clock phase calibration. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.

Abstract: A receiver with clock phase calibration. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.

Abstract: A receiver with clock phase calibration. A first sampling circuit generates first digital data based on an input signal, a sampling phase of the first sampling circuit controlled by a first clock signal. A second sampling circuit generates second digital data based on the input signal, a sampling phase of the second sampling circuit controlled by a second clock signal. Circuitry within the receiver calibrates the clocks in different stages. During a first calibration stage, a phase of the second clock signal is adjusted while the first digital data is selected for generating the output data. During a second calibration stage, a phase of the first clock signal is adjusted while the first digital data is selected for the output data path.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.

Abstract: An integrated circuit device includes a transmitter circuit operable to transmit a timing signal over a first wire to a DRAM. The DRAM receives a first signal having a balanced number of logical zero-to-one transitions and one-to-zero transitions and samples the first signal at a rising edge of the timing signal to produce a respective sampled value. The device further includes a receiver circuit to receive the respective sampled value from the DRAM over a plurality of wires separate from the first wire. In a first mode, the transmitter circuit repeatedly transmits incrementally offset versions of the timing signal to the DRAM until sampled values received from the DRAM change from a logical zero to a logical one or vice versa; and in a second mode, it transmits write data over the plurality of wires to the DRAM according to a write timing offset generated based on the sampled values.