Patents by Inventor Roy Boerner

Roy Boerner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DOCUMENT DRIVEN METHODS OF MANAGING THE CONTENT OF DATABASES THAT CONTAIN INFORMATION RELATING TO SEMICONDUCTOR MANUFACTURING OPERATIONS
    Publication number: 20140324769
    Abstract: One illustrative method disclosed herein includes storing a semiconductor manufacturing document in a document management system, wherein the semiconductor manufacturing document comprises semiconductor manufacturing data, and actuating an extractor tool to extract at least a portion of the semiconductor manufacturing data from the semiconductor manufacturing document and transfer the extracted semiconductor manufacturing data to at least one table in the semiconductor manufacturing database.
    Type: Application
    Filed: April 25, 2013
    Publication date: October 30, 2014
    Applicant: GLOBALFOUNDRIES Inc.
    Inventors: Stephan Puelm, Roy Boerner, Alexander Kroll, Uwe Heber, Thomas Kretschmer, Hardy Schumacher, Uwe Mende-Preusser, Gert Poeschel
  • Method for automatic generation of throughput models for semiconductor tools
    Patent number: 8504186
    Abstract: The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages with high statistical relevance.
    Type: Grant
    Filed: January 20, 2012
    Date of Patent: August 6, 2013
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Kilian Schmidt, Roy Boerner, Jan Lange
  • METHOD AND A SYSTEM FOR AUTOMATIC GENERATION OF THROUGHPUT MODELS FOR SEMICONDUCTOR TOOLS
    Publication number: 20120130523
    Abstract: The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages with high statistical relevance.
    Type: Application
    Filed: January 20, 2012
    Publication date: May 24, 2012
    Inventors: Killian Schmidt, Roy Boerner, Jan Lange
  • Method and system for automatic generation of throughput models for semiconductor tools
    Patent number: 8170704
    Abstract: The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages with high statistical relevance.
    Type: Grant
    Filed: March 9, 2009
    Date of Patent: May 1, 2012
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Kilian Schmidt, Roy Boerner, Jan Lange
  • METHOD AND SYSTEM FOR AUTOMATIC GENERATION OF THROUGHPUT MODELS FOR SEMICONDUCTOR TOOLS
    Publication number: 20090248189
    Abstract: The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages with high statistical relevance.
    Type: Application
    Filed: March 9, 2009
    Publication date: October 1, 2009
    Inventors: Kilian Schmidt, Roy Boerner, Jan Lange