Abstract: A lifting and supporting device includes elongated supports. One support has a handle attached thereto. A base section has rectilinear support arms attached thereto. The arms are arranged in parallel transverse to a longitudinal length of the base section. The base section is secured to the lower end portions of the supports. Side panels are secured to the upper end portions of the supports. A moveable section is disposed medially of the side panels. A pulley mechanism lifts the movable section in a vertical direction between raised and lowered positions. The pulley mechanism is partially disposed within the cavity and is anchored to the moveable section and the side panels. The pulley mechanism includes at least five pulleys for to decrease the applied force for lifting a cabinet on the movable section. A pressure plate is used to maintain the movable section in a static position during non-operating conditions.

Abstract: A method and apparatus for inspecting the surface of an object such as a semiconductor wafer for contaminant particles. The apparatus includes a light source for illuminating an area on the surface of the object. A camera is positioned above the surface of the object and detects light scattered by any particles present on the surface at that area, the camera detecting light scattered from the area over a field of view, or window, which is defined by the camera, a focusing lens and the relative distance therebetween. A computer is coupled to the camera and serves to store, process, identify and/or analyze the light detected by the camera. The computer also serves to calculate a minimum light intensity threshold level which is dynamic to compensate for variances in the background light intensity of different portions of the object. The value of the threshold level is calculated for each window of the object defined by the apparatus using the equation: T.sub.W =.mu..sub.W +.eta.-.delta..sub.W, where T.sub.