Patents by Inventor Roy Schiff

Roy Schiff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5517315
    Abstract: A reflectometer wherein a light having a predetermined wavelength is projected into an integrating sphere containing a sample whose reflectance is to be measured. As the projected light strikes the sample, rays are reflected back the walls of the integrating sphere; some of which strike the area within the field-of-view of a concentrator. The rays striking within the field-of-view of the concentrator are focused upon a detector element which allows one to determine the reflectance of the sample. A control means is utilized to control the wavelength of the projected light through a spectrophotometer, and calculate the reflectance of the sample.
    Type: Grant
    Filed: October 29, 1993
    Date of Patent: May 14, 1996
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Keith A. Snail, Roy Schiff, David B. Chenault, Leonard M. Hanssen