Abstract: In a general aspect, a circuit can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance and a temperature information circuit. The temperature information circuit can be configured to: receive a first voltage from the first terminal of the temperature-sensitive resistance; receive a second voltage from the second terminal of the temperature-sensitive resistance; and provide temperature information based on the first voltage and the second voltage. The temperature information circuit can include a first comparison circuit configured to determine a difference between the first voltage and the second voltage, and a second comparison circuit configured to compare an output of the first comparison circuit to a reference.

Abstract: In a general aspect, a circuit can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance and a temperature information circuit. The temperature information circuit can be configured to: receive a first voltage from the first terminal of the temperature-sensitive resistance; receive a second voltage from the second terminal of the temperature-sensitive resistance; and provide temperature information based on the first voltage and the second voltage. The temperature information circuit can include a first comparison circuit configured to determine a difference between the first voltage and the second voltage, and a second comparison circuit configured to compare an output of the first comparison circuit to a reference.

Abstract: This document discusses, among other things, an apparatus and method for providing temperature information. In an example, an integrated circuit apparatus can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance, and a temperature information circuit configured to receive a first voltage from the first terminal of the temperature-sensitive resistance and a second voltage from the second terminal of the temperature-sensitive resistance. The temperature information circuit can provide the temperature information using the first and second voltages.

Abstract: Fuse driver circuits, fuse driver testing circuitry, and methods for testing the fuse driver circuits using the testing circuitry are described. In some embodiments, the fuse driver circuit can be made using a fuse, a NMOS transistor, and a PMOS transistor. The drain of the NMOS transistor can be connected to the negative end of the fuse. The source of the NMOS transistor can be connected to ground. The drain of the PMOS transistor can be connected to a positive end of the fuse. The NMOS and PMOS transistors provide enhanced robustness to the fuse driver circuit in both undervoltage and overvoltage conditions. Other embodiments are also described.

Abstract: This document discusses, among other things, an apparatus and method for providing temperature information. In an example, an integrated circuit apparatus can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance, and a temperature information circuit configured to receive a first voltage from the first terminal of the temperature-sensitive resistance and a second voltage from the second terminal of the temperature-sensitive resistance. The temperature information circuit can provide the temperature information using the first and second voltages.

Abstract: This document discusses, among other things, an apparatus and method for providing temperature information. In an example, an integrated circuit apparatus can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance, and a temperature information circuit configured to receive a first voltage from the first terminal of the temperature-sensitive resistance and a second voltage from the second terminal of the temperature-sensitive resistance. The temperature information circuit can provide the temperature information using the first and second voltages.

Abstract: This document discusses, among other things, an apparatus and method for providing temperature information. In an example, an integrated circuit apparatus can include a first resistor configured to be coupled to a first terminal of a temperature-sensitive resistance, a second resistor configured to be coupled to a second terminal of the temperature-sensitive resistance, and a temperature information circuit configured to receive a first voltage from the first terminal of the temperature-sensitive resistance and a second voltage from the second terminal of the temperature-sensitive resistance. The temperature information circuit can provide the temperature information using the first and second voltages.

Abstract: A TTL inverter buffer circuit is provided with a switched current that produces hysteresis in the threshold values. The current is switched on by a control circuit when the input logic is low and off when the logic is high. The control circuit receives its sense from the logic state so that when the input logic is low a high threshold is created and when the input logic is high a low threshold is created. The difference is the circuit hysteresis voltage which is dependent upon the switched current and a resistor.