Patents by Inventor Rubén Alvarez Sánchez
Rubén Alvarez Sánchez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 12173062Abstract: The present disclosure relates to modified anti-TNF? polypeptides, compositions comprising modified anti-TNF? polypeptides, methods of making the same, and methods of using the modified anti-TNF? polypeptides for treatment of diseases. In one aspect, the disclosure relates to the treatment of inflammatory disorders using the modified anti-TNF? polypeptides.Type: GrantFiled: July 9, 2022Date of Patent: December 24, 2024Assignee: Bright Peak Therapeutics AGInventors: Bertolt Kreft, Vijaya Raghavan Pattabiraman, Rubén Alvarez Sanchez, Magali Muller, Jean-Philippe Carralot
-
Publication number: 20240158537Abstract: The present disclosure relates to modified anti-PD-1 polypeptides linked to IL-7, pharmaceutical compositions comprising modified anti-PD-1 polypeptides linked to IL-7, methods of making anti-PD-1 polypeptides linked to IL-7, and methods of using the modified anti-PD-1 polypeptides linked to IL-7 for treatment of diseases. In one aspect, the disclosure relates to methods of treating cancer in a subject using the modified anti-PD-1 polypeptides linked to IL-7. Also provided herein is synthetic IL-7 and methods of manufacture thereof.Type: ApplicationFiled: July 9, 2022Publication date: May 16, 2024Inventors: Vijaya Raghavan PATTABIRAMAN, Bertolt KREFT, Jean-Philippe CARRALOT, Rubén ALVAREZ SANCHEZ, Magali MULLER, Matilde ARÉVALO-RUIZ
-
Publication number: 20230303649Abstract: The present disclosure relates to modified IL-2 polypeptides, compositions comprising modified IL-2 polypeptides, methods of making the same, and methods of using the modified IL-2 polypeptides for treatment of diseases including autoimmune diseases. In one aspect, the disclosure relates to the treatment of autoimmune diseases using the modified IL-2 polypeptides. In some embodiments, the disclosed IL-2 polypeptides exhibit enhanced binding to IL-2 receptor ? and/or reduced binding to IL-2 receptor ?. In another aspect, the modified IL-2 polypeptides exhibit enhanced ability to activate T regulatory cells compared to T effector cells.Type: ApplicationFiled: July 9, 2022Publication date: September 28, 2023Inventors: Bertolt KREFT, Vijaya Raghavan PATTABIRAMAN, Rubén ALVAREZ SANCHEZ, Magali MULLER, Jean-Philippe CARRALOT
-
Publication number: 20230250181Abstract: The present disclosure relates to modified anti-PD-1 polypeptides, pharmaceutical compositions comprising modified anti-PD-1 polypeptides, methods of making anti-PD-1 polypeptides, and methods of using the modified anti-PD-1 polypeptides for treatment of diseases. In one aspect, the disclosure relates to methods of treating cancer in a subject using the modified anti-PD-1 polypeptides.Type: ApplicationFiled: July 9, 2022Publication date: August 10, 2023Inventors: Vijaya Raghavan PATTABIRAMAN, Bertolt KREFT, Jean-Philippe CARRALOT, Rubén ALVAREZ SANCHEZ, Magali MULLER, Matilde ARÉVALO-RUIZ
-
Patent number: 11714357Abstract: A method and associated computer program for predicting an electrical characteristic of a substrate subject to a process. The method includes determining a sensitivity of the electrical characteristic to a process characteristic, based on analysis of electrical metrology data including electrical characteristic measurements from previously processed substrates and of process metrology data including measurements of at least one parameter related to the process characteristic measured from the previously processed substrates; obtaining process metrology data related to the substrate describing the at least one parameter; and predicting the electrical characteristic of the substrate based on the sensitivity and the process metrology data.Type: GrantFiled: June 30, 2021Date of Patent: August 1, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Alexander Ypma, Cyrus Emil Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Dag Sonntag, Hakki Ergün Cekli, Ruben Alvarez Sanchez, Shih-Chin Liu, Simon Philip Spencer Hastings, Boris Menchtchikov, Christiaan Theodoor De Ruiter, Peter Ten Berge, Michael James Lercel, Wei Duan, Pierre-Yves Jerome Yvan Guittet
-
Publication number: 20230201364Abstract: The present disclosure relates to conjugate compositions comprising an antibody or an antigen binding fragment, a synthetic protein, and a linker. The disclosure further relates to methods of making the conjugate compositions and to methods of using the conjugate compositions for the treatment of diseases. In one aspect, the disclosure relates to the treatment of cancer using the conjugate compositions.Type: ApplicationFiled: July 9, 2022Publication date: June 29, 2023Inventors: Vijaya Raghavan PATTABIRAMAN, Bertolt KREFT, Jean-Philippe CARRALOT, Rubén ALVAREZ SANCHEZ, Magali MULLER, Matilde ARÉVALO-RUIZ
-
Publication number: 20230183331Abstract: The present disclosure relates to modified anti-TNF? polypeptides, compositions comprising modified anti-TNF? polypeptides, methods of making the same, and methods of using the modified anti-TNF? polypeptides for treatment of diseases. In one aspect, the disclosure relates to the treatment of inflammatory disorders using the modified anti-TNF? polypeptides.Type: ApplicationFiled: July 9, 2022Publication date: June 15, 2023Inventors: Bertolt KREFT, Vijaya Raghavan PATTABIRAMAN, Rubén ALVAREZ SANCHEZ, Magali MULLER, Jean-Philippe CARRALOT
-
Publication number: 20230181754Abstract: The present disclosure relates to modified anti-PD-L1 polypeptides, compositions comprising modified anti-PD-L1 polypeptides, methods of making the same, and methods of using the modified anti-PD-L1 polypeptides for treatment of diseases. In one aspect, the disclosure relates to the treatment of cancer using the modified anti-PD-L1 polypeptides.Type: ApplicationFiled: July 9, 2022Publication date: June 15, 2023Inventors: Vijaya Raghavan PATTABIRAMAN, Bertolt KREFT, Jean-Philippe CARRALOT, Rubén ALVAREZ SANCHEZ
-
Publication number: 20220042022Abstract: The present invention relates to antisense oligonucleotides (oligomers) that are complementary to HTRA1, leading to modulation of the expression of HTRA1. Modulation of HTRA1 expression is beneficial for a range of medical disorders, such as macular degeneration, e.g. age-related macular degeneration.Type: ApplicationFiled: August 17, 2021Publication date: February 10, 2022Inventors: Rubén Alvarez Sánchez, Roberto Iacone, Peter Hagedorn, Susanne Kammler, Søren Ottosen, Sindri Traustason, Heidi Rye Hudlebusch, Lykke Pedersen, Marco Berrera, Andreas Dieckmann
-
Publication number: 20210325788Abstract: A method and associated computer program for predicting an electrical characteristic of a substrate subject to a process. The method includes determining a sensitivity of the electrical characteristic to a process characteristic, based on analysis of electrical metrology data including electrical characteristic measurements from previously processed substrates and of process metrology data including measurements of at least one parameter related to the process characteristic measured from the previously processed substrates; obtaining process metrology data related to the substrate describing the at least one parameter; and predicting the electrical characteristic of the substrate based on the sensitivity and the process metrology data.Type: ApplicationFiled: June 30, 2021Publication date: October 21, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Alexander YPMA, Cyrus Emil TABERY, Simon Hendrik Celine VAN GORP, Chenxi LIN, Dag SONNTAG, Hakki Ergün CEKLI, Ruben ALVAREZ SANCHEZ, Shih-Chin LIU, Simon Philip Spencer HASTINGS, Boris MENCHTCHIKOV, Christiaan Theodoor DE RUITER, Peter TEN BERGE, Michael James LERCEL, Wei DUAN, Pierre-Yves Jerome Yvan GUITTET
-
Patent number: 11086229Abstract: A method and associated computer program for predicting an electrical characteristic of a substrate subject to a process. The method includes determining a sensitivity of the electrical characteristic to a process characteristic, based on analysis of electrical metrology data including electrical characteristic measurements from previously processed substrates and of process metrology data including measurements of at least one parameter related to the process characteristic measured from the previously processed substrates; obtaining process metrology data related to the substrate describing the at least one parameter; and predicting the electrical characteristic of the substrate based on the sensitivity and the process metrology data.Type: GrantFiled: March 29, 2018Date of Patent: August 10, 2021Assignee: ASML Netherlands B.V.Inventors: Alexander Ypma, Cyrus Emil Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Dag Sonntag, Hakki Ergün Cekli, Ruben Alvarez Sanchez, Shih-Chin Liu, Simon Philip Spencer Hastings, Boris Menchtchikov, Christiaan Theodoor De Ruiter, Peter Ten Berge, Michael James Lercel, Wei Duan, Pierre-Yves Jerome Yvan Guittet
-
Publication number: 20200378970Abstract: The present invention relates to the use of HTRA1 mRNA antagonists in the treatment of eye disorders, such as macular degeneration, and the use of an HTRA1 levels in the aqueous and vitreous humor as a diagnostic biomarker for the suitability of treatment of a subject with an HTRA1 mRNA antagonist.Type: ApplicationFiled: December 19, 2018Publication date: December 3, 2020Inventors: Rubén Alvarez Sánchez, Roberto Iacone, Peter Jakob, Jean-Luc Mary, Heidi Rye Hudlebusch, Thomas Peter John Dunkley, Corinne Stucki, Ulrich Friedrich Oskar Luhmann, Carolin Rakebrandt
-
Publication number: 20200157546Abstract: The present invention relates to antisense oligonucleotides (oligomers) that are complementary to HTRA1, leading to modulation of the expression of HTRA1. Modulation of HTRA1 expression is beneficial for a range of medical disorders, such as macular degeneration, e.g. age-related macular degeneration.Type: ApplicationFiled: October 28, 2019Publication date: May 21, 2020Inventors: Rubén Alvarez Sánchez, Roberto Iacone, Peter Hagedorn, Susanne Kammler, Søren Ottosen, Sindri Traustason, Heidi Rye Hudlebusch, Lykke Pedersen, Marco Berrera, Andreas Dieckmann
-
Publication number: 20200103761Abstract: A method and associated computer program for predicting an electrical characteristic of a substrate subject to a process. The method includes determining a sensitivity of the electrical characteristic to a process characteristic, based on analysis of electrical metrology data including electrical characteristic measurements from previously processed substrates and of process metrology data including measurements of at least one parameter related to the process characteristic measured from the previously processed substrates; obtaining process metrology data related to the substrate describing the at least one parameter; and predicting the electrical characteristic of the substrate based on the sensitivity and the process metrology data.Type: ApplicationFiled: March 29, 2018Publication date: April 2, 2020Applicant: ASML NETHERLANDS B.V.Inventors: Alexander YPMA, Cyrus Emil TABERY, Simon Hendrik Celine VAN GORP, Chenxi LIN, Dag SONNTAG, Hakki Ergün CEKLI, Ruben ALVAREZ SANCHEZ, Shih-Chin LIU, Simon Philip Spencer HASTINGS, Boris MENCHTCHIKOV, Christiaan Theodoor DE RUTTER, Peter TEN BERGE, Michael James LERCEL, Wei DUAN, Pierre-Yves Jerome Yvan GUITTET
-
Publication number: 20190055564Abstract: The present invention relates to antisense oligonucleotides (oligomers) that are complementary to HTRA1, leading to modulation of the expression of HTRA1. Modulation of HTRA1 expression is beneficial for a range of medical disorders, such as macular degeneration, e.g. age-related macular degeneration.Type: ApplicationFiled: May 29, 2018Publication date: February 21, 2019Inventors: Rubén Alvarez Sánchez, Roberto Iacone, Peter Hagedorn, Susanne Kammler, Søren Ottosen, Sindri Traustason, Heidi Rye Hudlebusch, Lykke Pedersen, Marco Berrera, Andreas Dieckmann
-
Patent number: 9977340Abstract: Diffraction models and scatterometry are used to reconstruct a model of a microscopic structure on a substrate. A plurality of candidate structures are defined, each represented by a plurality of parameters (p1, p2, etc.)). A plurality of model diffraction signals are calculated by simulating illumination of each of the candidate structures. The structure is reconstructed by fitting one or more of the model diffraction signals to a signal detected from the structure. In the generation of the candidate structures, a model recipe is used in which parameters are designated as either fixed or variable. Among the variable parameters, certain parameters are constrained to vary together in accordance with certain constraints, such as linear constraints. An optimized set of constraints, and therefore an optimized model recipe, is determined by reference to a user input designating one or more parameters of interest for a measurement, and by simulating the reconstruction process reconstruction.Type: GrantFiled: May 5, 2011Date of Patent: May 22, 2018Assignee: ASML Netherlands B.V.Inventors: Maria Johanna Hendrika Aben, Hugo Augustinus Joseph Cramer, Noelle Martina Wright, Ruben Alvarez Sanchez, Martijn Jaap Daniel Slob
-
Patent number: 9360768Abstract: A method defines one or more monitoring target profiles, collects and stores initial calibration data of the metrology apparatus, compiling a library of spectra that would be observed from inspection of the monitoring target profiles using the metrology apparatus calibrated according to the initial calibration data. Some operations can be performed periodically, e.g., on a daily basis: obtaining current calibration data from the apparatus, modeling the effect of the current calibration data on the metrology apparatus operation, and using the result of the modeling and the contents of the library to determine any differences between one or more values of the initial calibration data and the current calibration data, and how these changes will be translated into changes in the measurement output for a given number of stacks and geometries.Type: GrantFiled: May 29, 2012Date of Patent: June 7, 2016Assignee: ASML Netherlands B.V.Inventors: Gerardo Bottiglieri, Elliott Gerard Mc Namara, Ruben Alvarez Sanchez
-
Patent number: 8848195Abstract: In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, by comparing representations of each of the measured spectra with one or more modeled representations of spectra calculated using variable parameter values. At least one parameter in the reconstruction for each spectrum can be linked to the value of the parameter used in the reconstruction for a different spectrum.Type: GrantFiled: October 22, 2009Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventors: Christian Marinus Leewis, Marcus Adrianus Van De Kerkhof, Karel Diederick Van Der Mast, Peter Clement Paul Vanoppen, Ruben Alvarez Sanchez
-
Patent number: 8410117Abstract: The invention is concerned with novel imidazopyrimidine derivatives of formula (I) wherein R1, R2 and R8 are as defined in the description and in the claims, as well as physiologically acceptable salts and esters thereof. These compounds inhibit PDE10A and can be used as pharmaceuticals.Type: GrantFiled: March 17, 2011Date of Patent: April 2, 2013Assignee: Hoffmann-La Roche Inc.Inventors: Ruben Alvarez Sanchez, Konrad Bleicher, Alexander Flohr, Luca Gobbi, Katrin Groebke Zbinzen, Matthias Koerner, Bernd Kuhn, Jens-Uwe Peters, Markus Rudolph
-
Publication number: 20120330592Abstract: A method defines one or more monitoring target profiles, collects and stores initial calibration data of the metrology apparatus, compiling a library of spectra that would be observed from inspection of the monitoring target profiles using the metrology apparatus calibrated according to the initial calibration data. Some operations can be performed periodically, e.g., on a daily basis: obtaining current calibration data from the apparatus, modeling the effect of the current calibration data on the metrology apparatus operation, and using the result of the modeling and the contents of the library to determine any differences between one or more values of the initial calibration data and the current calibration data, and how these changes will be translated into changes in the measurement output for a given number of stacks and geometries.Type: ApplicationFiled: May 29, 2012Publication date: December 27, 2012Applicant: ASML Netherlands B.V.Inventors: Gerardo Bottiglieri, Elliott Gerard Mc Namara, Ruben Alvarez Sanchez