Patents by Inventor Ruben Zadoyan
Ruben Zadoyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9226853Abstract: Methods of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: GrantFiled: March 17, 2015Date of Patent: January 5, 2016Assignee: AMO Development, LLCInventors: Zsolt Bor, Ruben Zadoyan, Marcel Bouvier, Guy V Holland
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Patent number: 9138351Abstract: Systems and methods of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: GrantFiled: March 17, 2015Date of Patent: September 22, 2015Assignee: AMO Development, LLCInventors: Ferenc Raksi, Ruben Zadoyan, Marcel Bouvier, Guy V. Holland
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Patent number: 9108270Abstract: System and method of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: GrantFiled: January 2, 2008Date of Patent: August 18, 2015Assignee: AMO DEVELOPMENT, LLCInventors: Ferenc Raksi, Ruben Zadoyan, Marcel Bouvier, Guy V. Holland
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Patent number: 9101446Abstract: Systems and methods of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: GrantFiled: March 11, 2013Date of Patent: August 11, 2015Assignee: IntraLase Corp.Inventors: Zsolt Bor, Ruben Zadoyan, Marcel Bouvier, Guy V Holland
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Publication number: 20150190282Abstract: Methods of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: ApplicationFiled: March 17, 2015Publication date: July 9, 2015Inventors: Zsolt Bor, Ruben Zadoyan, Marcel Bouvier, Guy V Holland
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Publication number: 20150190283Abstract: Systems and methods of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: ApplicationFiled: March 17, 2015Publication date: July 9, 2015Inventors: Ferenc Raksi, Ruben Zadoyan, Marcel Bouvier, Guy V. Holland
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Publication number: 20140160467Abstract: System and method are disclosed for measuring properties (e.g., shrinkage) of a photosensitive material (e.g., photoresist) while undergoing a defined photolithography process. The system includes a photolithography processing system adapted to perform a defined photolithography process of the photosensitive material, and a coherent anti-Stokes Raman scattering (CARS) microscopy system adapted to perform measurement of the properties of the photosensitive material. In another aspect, the CARS microscopy system is adapted to measure properties of the photosensitive material simultaneous with the defined photolithography process being performed on the photosensitive material by the photolithography processing system. In still another aspect, the CARS microscopy system is adapted to measure properties of the photosensitive material while the defined photolithography process on the photosensitive material is paused.Type: ApplicationFiled: February 17, 2014Publication date: June 12, 2014Inventors: Tommaso Baldacchini, Ruben Zadoyan
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Patent number: 8441630Abstract: System and method are disclosed for in-situ monitoring of a specimen while undergoing a defined process. The system includes a processing system adapted to perform the defined process on the specimen, and a coherent anti-Stokes Raman scattering (CARS) microscopy system adapted to in-situ monitor the specimen. In another aspect, the CARS microscopy system is adapted to in-situ monitor the specimen simultaneous with the defined process being performed on the specimen by the processing system. In still another aspect, the CARS microscopy system is adapted to perform a measurement of the specimen while the defined process being performed on the specimen is paused or temporarily halted.Type: GrantFiled: May 11, 2010Date of Patent: May 14, 2013Assignee: Newport CorporationInventors: Tommaso Baldacchini, Ruben Zadoyan
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Patent number: 8231612Abstract: A method of photoaltering a material using a pulsed laser beam includes selecting a first pulse energy and a first focal point separation based on a relationship of pulse energy and focal point separation combinations enabling layer separation of the material by photoalteration, and scanning the pulsed laser beam along a scan region at the first pulse energy and the first focal point separation. The relationship has a slope and has a distinct change in the slope. The distinct change in the slope is associated with a second pulse energy of the relationships and the first pulse energy is equal to or less than the second pulse energy.Type: GrantFiled: November 19, 2007Date of Patent: July 31, 2012Assignee: AMO Development LLC.Inventors: Ruben Zadoyan, Michael Karavitis, Ronald M. Kurtz
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Patent number: 8089679Abstract: A system for laser amplification includes a dual-crystal Pockels cell which is used to control emission of laser pulses from an ultra-fast laser. The Pockels cell is constructed to enable adjustment of the rotational orientation of one crystal relative to the other crystal. The rotational orientation of one or both crystals in the Pockels cell is adjusted to control sidebands in the laser pulse.Type: GrantFiled: September 29, 2010Date of Patent: January 3, 2012Assignee: AMO Development LLC.Inventors: Ruben Zadoyan, Michael Karavitis
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Patent number: 8057463Abstract: A system for adaptive laser scanning correction includes a laser scanner coupled to a controller. The controller develops control signals for the laser scanner for a directed scan pattern that is modified to compensate for a characteristic scan-pattern distortion introduced by the laser scanner. The laser scanner responds to the control signals to provide an actual scan pattern approaching a target scan-pattern shape. The system may be useful for ophthalmologic laser surgery and other applications requiring precise control over scan pattern shape and a high scanning speed.Type: GrantFiled: April 7, 2006Date of Patent: November 15, 2011Assignee: AMO Development, LLC.Inventors: Ruben Zadoyan, Michael Karavitis, Peter Goldstein, Mike White, Michael Otter
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Publication number: 20110267683Abstract: System and method are disclosed for in-situ monitoring of a specimen while undergoing a defined process. The system includes a processing system adapted to perform the defined process on the specimen, and a coherent anti-Stokes Raman scattering (CARS) microscopy system adapted to in-situ monitor the specimen. In another aspect, the CARS microscopy system is adapted to in-situ monitor the specimen simultaneous with the defined process being performed on the specimen by the processing system. In still another aspect, the CARS microscopy system is adapted to perform a measurement of the specimen while the defined process being performed on the specimen is paused or temporarily halted.Type: ApplicationFiled: May 11, 2010Publication date: November 3, 2011Applicant: NEWPORT CORPORATIONInventors: Tommaso Baldacchini, Ruben Zadoyan
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Publication number: 20110013262Abstract: A system for laser amplification includes a dual-crystal Pockels cell which is used to control emission of laser pulses from an ultra-fast laser. The Pockels cell is constructed to enable adjustment of the rotational orientation of one crystal relative to the other crystal. The rotational orientation of one or both crystals in the Pockels cell is adjusted to control sidebands in the laser pulse.Type: ApplicationFiled: September 29, 2010Publication date: January 20, 2011Applicant: AMO Development, LLCInventors: Ruben Zadoyan, Michael Karavitis
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Patent number: 7830581Abstract: A system for laser amplification includes a dual-crystal Pockels cell which is used to control emission of laser pulses from an ultra-fast laser. The Pockels cell is constructed to enable adjustment of the rotational orientation of one crystal relative to the other crystal. The rotational orientation of one or both crystals in the Pockels cell is adjusted to control sidebands in the laser pulse.Type: GrantFiled: March 31, 2009Date of Patent: November 9, 2010Assignee: AMO Development, LLCInventors: Ruben Zadoyan, Michael Karavitis
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Publication number: 20090237768Abstract: A system for laser amplification includes a dual-crystal Pockels cell which is used to control emission of laser pulses from an ultra-fast laser. The Pockels cell is constructed to enable adjustment of the rotational orientation of one crystal relative to the other crystal. The rotational orientation of one or both crystals in the Pockels cell is adjusted to control sidebands in the laser pulse.Type: ApplicationFiled: March 31, 2009Publication date: September 24, 2009Applicant: AMO Development, LLCInventors: Ruben Zadoyan, Michael Karavitis
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Patent number: 7584756Abstract: The present invention provides a method for minimizing fluence distribution of a laser over a predetermined pattern. In particular, the method is useful for minimizing fluence variance over a predetermined pattern for lasers used in ophthalmic surgery.Type: GrantFiled: August 17, 2004Date of Patent: September 8, 2009Assignee: AMO Development, LLCInventors: Ruben Zadoyan, Guy Vern Holland, Zolt Bor, Marcel Bouvier
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Publication number: 20090171329Abstract: System and method of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.Type: ApplicationFiled: January 2, 2008Publication date: July 2, 2009Applicant: Advanced Medical Optics, Inc.Inventors: Ferenc Raksi, Ruben Zadoyan, Marcel Bouvier, Guy V. Holland
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Publication number: 20090126870Abstract: A method of photoaltering a material using a pulsed laser beam includes selecting a first pulse energy and a first focal point separation based on a relationship of pulse energy and focal point separation combinations enabling layer separation of the material by photoalteration, and scanning the pulsed laser beam along a scan region at the first pulse energy and the first focal point separation. The relationship has a slope and has a distinct change in the slope. The distinct change in the slope is associated with a second pulse energy of the relationships and the first pulse energy is equal to or less than the second pulse energy.Type: ApplicationFiled: November 19, 2007Publication date: May 21, 2009Applicant: Advanced Medical Optics, Inc.Inventors: Ruben Zadoyan, Michael Karavitis, Ronald M. Kurtz
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Patent number: 7522642Abstract: A system for laser amplification includes a dual-crystal Pockels cell which is used to control emission of laser pulses from an ultra-fast laser. The Pockels cell is constructed to enable adjustment of the rotational orientation of one crystal relative to the other crystal. The rotational orientation of one or both crystals in the Pockels cell is adjusted to control sidebands in the laser pulse.Type: GrantFiled: March 29, 2006Date of Patent: April 21, 2009Assignee: AMO Development LLCInventors: Ruben Zadoyan, Michael Karavitis
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Publication number: 20080062430Abstract: The present invention generally relates to a method and system for determining the position and alignment of a plane in relation to an intersecting axis and using that known position and alignment to allow for corrections to be made when using the plane as a reference plane. More particularly, the invention relates to a method and system for determining the angle of tilt of a planar surface in relation to a laser beam, and using the determined angle of tilt to calculate a correction factor to be applied to the laser beam. Briefly stated, the method and system ultimately calculates a correction factor, z-offset, that is applied when using the laser beam in a procedure.Type: ApplicationFiled: August 6, 2007Publication date: March 13, 2008Applicant: INTERLASE CORPORATIONInventors: Christopher Horvath, Ruben Zadoyan, Ferenc Raksi, Zsolt Bor, Guy Holland, Tibor Juhasz