Patents by Inventor Rudolf Kessler

Rudolf Kessler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8780354
    Abstract: The present invention relates to a method for analyzing chromosomes through preparing a chromosome preparation, measuring at least one interference characteristic of the chromosome preparation and characterizing at least one chromosome structure by way of the interference characteristic. Also, the invention relates to the use of a near-field microscope for analyzing un-dyed chromosomes.
    Type: Grant
    Filed: February 19, 2009
    Date of Patent: July 15, 2014
    Assignee: Hochschule Reutlingen
    Inventors: Rudolf Kessler, Tobias Merz, Karsten Rebner
  • Publication number: 20110058177
    Abstract: The present invention relates to a method for analyzing chromosomes by preparing a chromosome preparation, measuring at least one interference property of the chromosome preparation and characterizing at least one chromosome structure by way of the interference property. Also, the invention relates to the use of a near field microscope for analyzing unstained chromosomes.
    Type: Application
    Filed: February 19, 2009
    Publication date: March 10, 2011
    Inventors: Rudolf Kessler, Tobias Merz, Karsten Rebner
  • Patent number: 7012698
    Abstract: A method is disclosed for contactless determination of product characteristics, particularly in continuous or discontinuous fabrication of layer systems formed of a plurality of layers with different optical characteristics. The measuring apparatus and measurement methods for determining the characteristics of one of the respective layers are predetermined depending on the optical characteristics of this layer and depending on the optical characteristics of layers situated above it in the measuring direction. In a measuring device for this purpose, a plurality of detectors are provided for wavelength regions directly adjoining one another. The detectors and the signal processing device are constructed such that the light coming from the measurement surface with wavelengths of 200 nm to more than 2400 nm is evaluated in its entirety.
    Type: Grant
    Filed: May 14, 2002
    Date of Patent: March 14, 2006
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Matthias Patzwald, Rudolf Kessler, Waltraud Kessler, Angela Schindler
  • Publication number: 20020191192
    Abstract: The invention is directed to a method for contactless determination of product characteristics, particularly in continuous or discontinuous fabrication of layer systems formed of a plurality of layers with different optical characteristics.
    Type: Application
    Filed: May 14, 2002
    Publication date: December 19, 2002
    Inventors: Matthias Patzwald, Rudolf Kessler, Waltraud Kessler, Angela Schindler
  • Patent number: 4985622
    Abstract: A method and an apparatus determines a predicted corrosion resistance of deep-drawable iron sheets for body parts of motor vehicles. The method is caarried out with a measuring apparatus comprising one or more light sources with which the iron sheet is irradiated. The reflected light is concentrated by lenses, filtered through filters and the filtered light rays are imaged on a plurality of photoreceivers. The ratios of two respective filter wavelengths are evaluated by a computer from the signals thus obtained. From the values of the quotients of the filter wavelengths, predictions can then be made as to the paint migration values to be expected of the deep-drawable iron sheets painted in a later operation. A simple quality control of the iron sheets supplied by manufacturers for the production of components for motor vehicles can be based on these values.
    Type: Grant
    Filed: June 12, 1989
    Date of Patent: January 15, 1991
    Assignee: Daimler-Benz AG
    Inventors: Rudolf Kessler, Winfried Degen, Dieter Oelkrug, Martin Tubach