Patents by Inventor Rudolfo Lucero

Rudolfo Lucero has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multilayer ceramic package transmission line probe
    Patent number: 6803836
    Abstract: A multilayer ceramic structure (30) includes a first ceramic layer (32), a second ceramic layer (34) adjacent to the first ceramic layer, and a transmission line (38) formed between the first and second ceramic layers. The transmission line includes first and second portions (44, 46) having a first width, third and fourth portions (47, 48) formed between the first and second portions and having a second width that is narrower than the first width, and a fifth portion (49) formed between the third and fourth portions. A probe (40), comprising a conductively filled via, is attached at one end to the fifth portion, the probe passing through the second ceramic layer for providing a test point (42). The structure compensates for return loss induced by the probe.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: October 12, 2004
    Assignee: Freescale Semiconductor, Inc.
    Inventors: John C. Estes, Rudolfo Lucero, Anthony M. Pavio
  • Multilayer ceramic package transmission line probe
    Publication number: 20040061576
    Abstract: A multilayer ceramic structure (30) includes a first ceramic layer (32), a second ceramic layer (34) adjacent to the first ceramic layer, and a transmission line (38) formed between the first and second ceramic layers. The transmission line includes first and second portions (44, 46) having a first width, third and fourth portions (47, 48) formed between the first and second portions and having a second width that is narrower than the first width, and a fifth portion (49) formed between the third and fourth portions. A probe (40), comprising a conductively filled via, is attached at one end to the fifth portion, the probe passing through the second ceramic layer for providing a test point (42). The structure compensates for return loss induced by the probe.
    Type: Application
    Filed: September 27, 2002
    Publication date: April 1, 2004
    Inventors: John C. Estes, Rudolfo Lucero, Anthony M. Pavio