Abstract: The invention relates to a method for processing data associated with a model characterizing a propagation of terahertz (THz) radiation in a spatial region, the spatial region comprising at least one terahertz device for emitting and/or receiving terahertz radiation and/or at least one object which can be subjected to terahertz radiation, said method comprising: providing the model; characterizing, by means of the model, a propagation of the terahertz radiation in the area of at least one boundary surface between two media that adjoin in the spatial region, wherein the model has a term that depends of at least one of the following elements: a) frequency of the terahertz radiation, b) spatial expansion of at least one of the two adjoining media, for example along a first spatial direction.

Abstract: Method for processing data associated with a model, wherein the model characterises a propagation of THz radiation, for example in the region of at least one terahertz device and/or at least one object that can be examined by means of the terahertz radiation, for example, wherein the method includes: analysing the model, wherein an analysis result is obtained, at least partially and/or intermittently saving the analysis result.

Abstract: The invention relates to a terahertz (THz) apparatus for transmitting and/or receiving THz radiation, comprising at least one THz element, which is designed to transmit and/or receive THz radiation, and a digital data processing device, wherein in particular the digital data processing device is designed to at least temporarily process a first signal of at least one component of the apparatus.

Abstract: An apparatus for transmitting and/or receiving terahertz, THz, radiation, comprising at least one terahertz element which is configured to generate and/or detect a THz signal, and at least one field-shaping element which in particular is assigned to the at least one terahertz element, wherein the at least one terahertz element is arranged in the region of a first surface of the field-shaping element.

Abstract: An apparatus determines a layer thickness of a plurality of layers arranged on a body. The apparatus includes a THz transmitter configured to emit a THz signal to said plurality of layers and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by at least one layer of said plurality of layers. The apparatus is configured to determine the layer thickness of at least one of said plurality of layers based on said reflected portion of said THz signal. The apparatus further includes a distance measuring device for determining at least one parameter characterizing a distance between said apparatus and said body, wherein said distance measuring device may include at least one optical triangulation sensor.

Abstract: An apparatus includes at least one Terahertz (THz) device that transmits or receives THz radiation or transmits and receives THz radiation. The apparatus also provides a flow of protective gas in at least one portion of the beam path of the THz radiation.

Abstract: A measuring device comprises a Terahertz, THz, transmitter configured to emit a THz signal to an object to be measured and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by said object. The said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device. The measuring device may vary a distance between said measuring head and said object to be measured, emit, by means of said THz transmitter, said THz signal to said object to be measured, receive said reflected portion of said THz signal, and determine a first parameter characterizing a detected signal proportional and/or related to said received reflected portion of said THz signal.

Abstract: A heterodyne optical spectrum analyzer (10) is configured for analyzing spectral information of an optical input signal (15). The analyzer (10) comprises a local oscillator source (20) configured for generating an optical local oscillator signal (38). An optical mixer (25) is configured for receiving the input signal (15) and the local oscillator signal (38), and for outputting a plurality of different combined optical signals (50), each combined optical signal (50) being derived from the input signal (15) and the local oscillator signal (38). An opto-electrical receiver (30) having a plurality of inputs (52) is configured for receiving the combined optical signals (50) and for providing an opto-electrical conversion thereof, and an output (54) for outputting electrical signals representing the received combined optical signals (50). A signal processor (35) is configured for deriving spectral information of the input signal (15) by analyzing the electrical signals.

Abstract: A calibration kit (100) for calibrating a connectable network analyzer (102), including a converter (104, 106) adapted for performing a conversion between an electrical signal and an optical signal, a calibration standard (108, 110) for calibrating the network analyzer (102), and a switch array (112) adapted for switching the converter (104, 106) and the calibration standard (108, 110) in a manner to enable an electrical calibration of the network analyzer (102) and a calibration of the converter (104, 106) coupled to the network analyzer (102).

Abstract: The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a power amplitude (O(?)) of the filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a wavelength of the filtered light beam (12), and providing the power amplitude as a function of the wavelength of the filtered light beam (12).

Abstract: The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a power amplitude (O(?)) of the filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a wavelength of the filtered light beam (12), and providing the power amplitude as a function of the wavelength of the filtered light beam (12).

Abstract: The invention relates to converting a first light signal (L1) into a second light signal (L2) polarized according to a set of different states of polarization, whereby the set of different polarization states is represented by a corresponding set, of Stokes vectors in a Stokes space representation, and wherein the end points of the set of Stokes vectors span a geometric shape, wherein, in response to a desired geometric shape with an arbitrary orientation in the Stokes space, a setting (C1, C2) of at least two adjustable optical elements (22, 23) arranged in an optical path between an optical input (201) and an optical output (202) is determined such that, while varying the wavelength of the input signal (L1) within a certain range, corresponding variations of the geometric shape are below a desired value.

Abstract: A calibration kit (100) for calibrating a connectable network analyzer (102), including a converter (104, 106) adapted for performing a conversion between an electrical signal and an optical signal, a calibration standard (108, 110) for calibrating the network analyzer (102), and a switch array (112) adapted for switching the converter (104, 106) and the calibration standard (108, 110) in a manner to enable an electrical calibration of the network analyzer (102) and a calibration of the converter (104, 106) coupled to the network analyzer (102).

Abstract: Deriving an optical property of a device under test includes generating a cavity light beam along a first optical path in external cavity, selecting a wavelength of the cavity light beam of light by means of a filter arrangement within the external cavity, providing an optical stimulus signal to a device under test by splitting at least a fraction of the cavity light beam, providing an optical response signal from the DUT or a signal derived there form back to the external cavity, so that said signal is passed over a second optical path passing the filter arrangement spatially different to the first optical path in order to generate a filtered optical response signal, and providing said filtered optical response signal to a detector unit.

Abstract: The invention relates to determining a chirp property) of an optical device, comprising: receiving an input optical signal from the optical device and generating an output optical signal by providing a change of a state of polarization by means of a polarization controller operating at a first setting and an interferometric superposition of two signal parts in any order, determining an optical intensity of the output optical signal, controlling the polarization controller to operate at a second setting in order to provide a different change of the state of polarization and repeating previous steps for determining a corresponding optical intensity, and determining the chirp property by evaluating the optical intensities determined in response to the different polarization controller settings.

Abstract: The invention relates to determining a polarization dependent property of an optical device under test, wherein a response signal is received from the device under test in response to an optical stimulus signal having an reference state of polarization, an output state of polarization of the response signal is determined, a reference information about the reference state of polarization is received, the reference state of polarization is determined on the base of the reference information and a predefined function describing the dependency of reference information versus the reference state of polarization, and the polarization dependent property is determined on the base of the reference state of polarization and the output state of polarization.

Abstract: The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a power amplitude (O(?)) of the filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a wavelength of the filtered light beam (12), and providing the power amplitude as a function of the wavelength of the filtered light beam (12).

Abstract: An optical property of a device under test is determined from a detected DUT response signal, or a signal derived therefrom, whereby the DUT response signal represents a signal response of the DUT in response to a composite signal or a signal derived from said composite signal. The composite signal comprises superimposed signals delayed with respect to each other.

Abstract: For determining a signal response characteristic of a device, a first signal is varied with a first function of time and simultaneously a second signal is varied with a second function of time, wherein the first function is different from the second function. The first and second signals are coupled to the device, wherein the device is exposed to a time-dependent disturbance signal. A signal response is received from the device in response to the first and second signals and the time-dependent disturbance signal. The signal response characteristic is derived by analyzing the received signal response in conjunction with the first and second signals, or a signal derived therefrom, and at least partially removing the time-dependent disturbance signal using the received signal response and the first and second signals, or a signal derived therefrom.

Abstract: The invention relates to determining a polarization dependent property of an optical device under test, wherein a response signal is received from the device under test in response to an optical stimulus signal having an reference state of polarization, an output state of polarization of the response signal is determined, a reference information about the reference state of polarization is received, the reference state of polarization is determined on the base of the reference information and a predefined function describing the dependency of reference information versus the reference state of polarization, and the polarization dependent property is determined on the base of the reference state of polarization and the output state of polarization.