Abstract: A method for operating a coating system for producing layer systems includes the steps of: (i) coating a layer system in a coating facility; (ii) determining a spectral actual measuring plot for the layer system in an optical measuring system; (iii) determining an actual data set by fitting a simulation target measuring plot to the actual measuring plot; (iv) determining actual layer parameters as computed actual layer parameters from the simulation target measuring plot by simulation of the layer system using the actual data set; (v) outputting the actual data set and the computed actual layer parameters at least to a decision system; (vi) providing quality requirement data; and (vii) deciding on an approval of the layer system in the decision system on the basis of a comparison of at least the actual data set, the computed actual layer parameters and. the quality requirement data. A coating system for producing layer systems is also disclosed.

Abstract: A self-controlling feedback method for operating at least one coating installation for producing layer systems, a method for producing a layer system in at least one coating installation, a method for running in a coating process in at least one coating installation for producing a layer system, a coating system for producing a layer system, a coating installation for producing a layer system, a system of coating installations for producing layer systems, a database for storing installation datasets, a computer program product for a method for operating at least one coating installation, and a data processing system for executing a data processing program are disclosed.

Abstract: An optical element includes a substrate and an interferometric reflection-reducing layer system on at least one surface of the substrate. The layer system includes a stack of at least four successive layer packets, wherein each layer packet includes a first sub-layer with a first optical depth and a second sub-layer with a second optical depth which differs from the first optical depth. The refractive index of each first sub-layer nearer the substrate is greater than the refractive index of each second sub-layer further away from the substrate, of the respective stack, wherein the layer system has a brightness, a colorfulness, and a hue angle of a residual reflection color. The value of a change in the hue angle of the residual reflection color in a range of a viewing angle with the boundary values of 0° and 30° relative to a surface normal to the layer system is smaller than the value of a change in the colorfulness in the range of the viewing angle.

Abstract: A layer system includes at least one stack of successive multilayers, wherein each multilayer includes a first partial layer with a first optical thickness and a second partial layer with a second optical thickness that is different from the first optical thickness. The multilayer has optical characteristics that are specified depending on a parameter which is a function of a ratio of quotients of the optical thickness of a partial layer with higher refractive characteristics and the optical thickness of a partial layer with lower refractive characteristics of the respective multilayers, wherein the index i denotes the order of the successive multilayers in the stack. The product of a reflectivity of the stack of multilayers and the parameter is less than for an anti-reflection and/or anti-reflective effect of the stack of multilayers, or is greater than or equal to 1 for a mirroring. An optical element may include a layer system and a method for producing such a layer system.

Abstract: A layer system includes at least one stack of successive multilayers, wherein each multilayer includes a first partial layer with a first optical thickness and a second partial layer with a second optical thickness that is different from the first optical thickness. The multilayer has optical characteristics that are specified depending on a parameter which is a function of a ratio of quotients of the optical thickness of a partial layer with higher refractive characteristics and the optical thickness of a partial layer with lower refractive characteristics of the respective multilayers, wherein the index i denotes the order of the successive multilayers in the stack. The product of a reflectivity of the stack of multilayers and the parameter is less than for an anti-reflection and/or anti-reflective effect of the stack of multilayers, or is greater than or equal to 1 for a mirroring. An optical element may include a layer system and a method for producing such a layer system.

Abstract: A layer system includes at least one stack of successive multilayers, wherein each multilayer includes a first partial layer with a first optical thickness and a second partial layer with a second optical thickness that is different from the first optical thickness. The multilayer has optical characteristics that are specified depending on a parameter which is a function of a ratio of quotients of the optical thickness of a partial layer with higher refractive characteristics and the optical thickness of a partial layer with lower refractive characteristics of the respective multilayers, wherein the index i denotes the order of the successive multilayers in the stack. The product of a reflectivity of the stack of multilayers and the parameter is less than for an anti-reflection and/or anti-reflective effect of the stack of multilayers, or is greater than or equal to 1 for a mirroring. An optical element may include a layer system and a method for producing such a layer system.

Abstract: Device and method for determining mechanical stresses in a substrate coating has a substrate holder and actuating element configured as a piezoelectric actuator moveable at least partially in relation to the holed. The actuating element mechanically prestresses the substrate by applying an electric starting voltage to the piezoelectric actuator to cause the actuating element to be partially displacement by a predetermined and/or determinable starting displacement relative to the holed. A coating is applied to a deposition area of the substrates and a change in displacement of the actuating element is determined.