Abstract: A test program generation method, a test program generation device, a computer readable storage medium, and an electronic equipment are disclosed. The test program generation method includes: acquiring a configuration information of the memory and a test logic for the memory; determining at least one type of test program components from a preset test program component library according to the test logic; and acquiring a test program according to the configuration information by combining a plurality of test program components. Types of the plurality of test program components are included in the determined at least one type of test program components. The test program generation method not only meets different test requirements and matches different test conditions, but also avoids coding errors and improve the efficiency and accuracy in generating a memory test program.

Abstract: The present disclosure provides a method, a device and a terminal for testing a memory chip. The method may include setting an attack mode and random attack parameters, generating a random attack command according to the attack mode and random attack parameters, attacking the memory chip according to the random attack command, and testing the attacked memory chip and generating a test result. This method is able to simulate various types of attacks and can thus perform a suitable test on the memory chip for the types of the actual attack. In addition, since the attacks can be randomized to any memory cell of the memory chip, testing of the whole memory chip is made possible.

Abstract: A chip testing method, device, electronic apparatus, and computer readable medium are provided, relating to the field of chip testing. The method includes: determining a language rule of a chip to be tested; determining product and timing specifications of the chip to be tested; selecting a test pattern from a test pattern library according to the language rule and the product and timing specifications; generating a test code according to the product and timing specifications and the test pattern; and automatically testing the chip to be tested by using the test code. The chip testing method, device, electronic apparatus and computer readable medium can automatically generate a big-data test code for complex memories, and rapidly generate, in a standardized way, test codes for DDR4 memories of different specifications, thereby improving the efficiency of chip product verification analysis.

Abstract: A test program generation method, a test program generation device, a computer readable storage medium, and an electronic equipment are disclosed. The test program generation method includes: acquiring a configuration information of the memory and a test logic for the memory; determining at least one type of test program components from a preset test program component library according to the test logic; and acquiring a test program according to the configuration information by combining a plurality of test program components. Types of the plurality of test program components are included in the determined at least one type of test program components. The test program generation method not only meets different test requirements and matches different test conditions, but also avoids coding errors and improve the efficiency and accuracy in generating a memory test program.

Abstract: The present disclosure provides a method, a device and a terminal for testing a memory chip. The method may include setting an attack mode and random attack parameters, generating a random attack command according to the attack mode and random attack parameters, attacking the memory chip according to the random attack command, and testing the attacked memory chip and generating a test result. This method is able to simulate various types of attacks and can thus perform a suitable test on the memory chip for the types of the actual attack. In addition, since the attacks can be randomized to any memory cell of the memory chip, testing of the whole memory chip is made possible.

Abstract: A chip testing method, device, electronic apparatus, and computer readable medium are provided, relating to the field of chip testing. The method includes: determining a language rule of a chip to be tested; determining product and timing specifications of the chip to be tested; selecting a test pattern from a test pattern library according to the language rule and the product and timing specifications; generating a test code according to the product and timing specifications and the test pattern; and automatically testing the chip to be tested by using the test code. The chip testing method, device, electronic apparatus and computer readable medium can automatically generate a big-data test code for complex memories, and rapidly generate, in a standardized way, test codes for DDR4 memories of different specifications, thereby improving the efficiency of chip product verification analysis.