Patents by Inventor Rui Hu

Rui Hu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8984450
    Abstract: The present disclosure provides a method of systematic defect extraction. Primary and secondary areas are defined in a wafer layout. A plurality of defects is identified by a first wafer inspection for an outside-process-window wafer. Defects located in the secondary area are removed. Defects associated with non-critical semiconductor features are also removed via a grouping process. Sensitive regions are defined around defects associated with critical semiconductor features. A second inspection is then performed on the sensitive regions for an inside-process-window wafer, thereby identifying a plurality of potentially systematic defects. Thereafter, a Scanning Electron Microscopy (SEM) process is performed to determine whether the defects in the sensitive regions of the inside-process-window wafer are true systematic defects.
    Type: Grant
    Filed: February 14, 2014
    Date of Patent: March 17, 2015
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Jia-Rui Hu, Kai-Hsiung Chen, Chih-Mihg Ke, Hua-Tai Lin, Tsai-Sheng Gau
  • Patent number: 8873812
    Abstract: An image segmentation method includes generating a hierarchy of regions by unsupervised segmentation of an input image. Each region is described with a respective region feature vector representative of the region. Hierarchical structures are identified, each including a parent region and its respective child regions in the hierarchy. Each hierarchical structure is described with a respective hierarchical feature vector that is based on the region feature vectors of the respective parent and child regions. The hierarchical structures are classified according to a set of predefined classes with a hierarchical classifier component that is trained with hierarchical feature vectors of hierarchical structures of training images. The training images have semantic regions labeled according to the set of predefined classes. The input image is segmented into a plurality of semantic regions based on the classification of the hierarchical structures and optionally also on classification of the individual regions.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: October 28, 2014
    Assignee: Xerox Corporation
    Inventors: Diane Larlus-Larrondo, Rui Hu, Craig Saunders, Gabriela Csurka
  • Publication number: 20140282334
    Abstract: The present disclosure provides a method of systematic defect extraction. Primary and secondary areas are defined in a wafer layout. A plurality of defects is identified by a first wafer inspection for an outside-process-window wafer. Defects located in the secondary area are removed. Defects associated with non-critical semiconductor features are also removed via a grouping process. Sensitive regions are defined around defects associated with critical semiconductor features. A second inspection is then performed on the sensitive regions for an inside-process-window wafer, thereby identifying a plurality of potentially systematic defects. Thereafter, a Scanning Electron Microscopy (SEM) process is performed to determine whether the defects in the sensitive regions of the inside-process-window wafer are true systematic defects.
    Type: Application
    Filed: February 14, 2014
    Publication date: September 18, 2014
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Jia-Rui Hu, Kai-Hsiung Chen, Chih-Mihg Ke, Hua-Tai Lin, Tsai-Sheng Gau
  • Patent number: 8755045
    Abstract: In one embodiment, a method for detecting design defects is provided. The method includes receiving design data of an integrated circuit (IC) on a wafer, measuring wafer topography across the wafer to obtain topography data, calculating a scanner moving average from the topography data and the design data to provide a scanner defocus map across the wafer, and determining a hotspot design defect from the scanner defocus map. A computer readable storage medium, and a system for detecting design defects are also provided.
    Type: Grant
    Filed: January 6, 2012
    Date of Patent: June 17, 2014
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Jyuh-Fuh Lin, Te-Chih Huang, Guo-Tsai Huang, Jia-Rui Hu, Chih-Ming Ke
  • Publication number: 20140161425
    Abstract: An electric heating system is provided with a heater mountable and removable in a cabinet by a user using a mounting system. The mounting system may include at least an installation member, installation receiver, and bracket. The installation member may interface with a surface or interior shelf of the cabinet. The bracket is includable between the surface or interior shelf of the cabinet and the surface of the heater. The installation member may be receivable by the bracket. The bracket may be received by the installation receiver or an additional bracket. The electrical cable may pass through a portal locatable on the cabinet. The heater may be an infrared heater with a fan. A wired or wireless remote with an optional display may control operation of the heater. A method is provided to manipulate the electric heating system.
    Type: Application
    Filed: December 6, 2012
    Publication date: June 12, 2014
    Applicant: TWIN-STAR INTERNATIONAL, INC.
    Inventors: Chris Harley, Rui Hu, Corey Levy, Jianmin Huang, Matthew Crowe
  • Publication number: 20140037198
    Abstract: An image segmentation method includes generating a hierarchy of regions by unsupervised segmentation of an input image. Each region is described with a respective region feature vector representative of the region. Hierarchical structures are identified, each including a parent region and its respective child regions in the hierarchy. Each hierarchical structure is described with a respective hierarchical feature vector that is based on the region feature vectors of the respective parent and child regions. The hierarchical structures are classified according to a set of predefined classes with a hierarchical classifier component that is trained with hierarchical feature vectors of hierarchical structures of training images. The training images have semantic regions labeled according to the set of predefined classes. The input image is segmented into a plurality of semantic regions based on the classification of the hierarchical structures and optionally also on classification of the individual regions.
    Type: Application
    Filed: August 6, 2012
    Publication date: February 6, 2014
    Applicant: Xerox Corporation
    Inventors: Diane Larlus-Larrondo, Rui Hu, Craig Saunders, Gabriela Csurka
  • Patent number: 8606780
    Abstract: Search queries for images are received from users. An original order of responsive images to the query is determined. Duplicate images and words associated with the duplicate images are identified for each of the responsive images. Common words associated with the duplicate images are identified. The responsive images are annotated with the common words and an annotated order is determined. A re-ranked order is determined based on the original order and the annotated order. Responsive images are presented to the user in the re-ranked order.
    Type: Grant
    Filed: July 8, 2011
    Date of Patent: December 10, 2013
    Assignee: Microsoft Corporation
    Inventors: Rui Hu, Xin-Jing Wang, Juan Xu, Xiao Kong
  • Publication number: 20130176558
    Abstract: In one embodiment, a method for detecting design defects is provided. The method includes receiving design data of an integrated circuit (IC) on a wafer, measuring wafer topography across the wafer to obtain topography data, calculating a scanner moving average from the topography data and the design data to provide a scanner defocus map across the wafer, and determining a hotspot design defect from the scanner defocus map. A computer readable storage medium, and a system for detecting design defects are also provided.
    Type: Application
    Filed: January 6, 2012
    Publication date: July 11, 2013
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Jyuh-Fuh Lin, Te-Chih Huang, Guo-Tsai Huang, Jia-Rui Hu, Chih-Ming Ke
  • Patent number: 8433140
    Abstract: Methods and computer-readable media for propagating content category information to images stored in a database are described. A seed image that is associated with a known content category is received. A content-based image retrieval is conducted using the seed image as a search query image. A number of search result images are identified. The content category is propagated to the search result images. Metadata associated with the search result images is aggregated and analyzed to identify domains that should also be associated with the content category. Additional images that are associated with the domain are identified and the content category propagated thereto. The process is iterated using the additional images as search query images for the content-based image retrieval.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: April 30, 2013
    Assignee: Microsoft Corporation
    Inventors: Qifa Ke, Ming Liu, Yi Li, Rui Hu, Yanfeng Sun
  • Publication number: 20130013591
    Abstract: Search queries for images are received from users. An original order of responsive images to the query is determined. Duplicate images and words associated with the duplicate images are identified for each of the responsive images. Common words associated with the duplicate images are identified. The responsive images are annotated with the common words and an annotated order is determined. A re-ranked order is determined based on the original order and the annotated order. Responsive images are presented to the user in the re-ranked order.
    Type: Application
    Filed: July 8, 2011
    Publication date: January 10, 2013
    Applicant: MICROSOFT CORPORATION
    Inventors: RUI HU, XIN-JING WANG, JUAN XU, XIAO KONG
  • Publication number: 20120308112
    Abstract: In one embodiment, a method for extracting systematic defects is provided. The method includes inspecting a wafer outside a process window to obtain inspection data, defining a defect pattern from the inspection data, filtering defects from design data using a pattern search for the defined defect pattern within the design data, inspecting defects inside the process window with greater sensitivity than outside the process window, and determining systematic defects inside the process window. A computer readable storage medium, and a system for extracting systematic defects are also provided.
    Type: Application
    Filed: June 2, 2011
    Publication date: December 6, 2012
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Jia-Rui Hu, Te-Chih Huang, Chih-Ming Ke, Hua-Tai Lin, Tsai-Sheng Gau
  • Patent number: 8325721
    Abstract: A method for selecting a hash function, a method for storing and searching a routing table and devices thereof are provided. The method for selecting a hash function includes: hashing data to be hashed by using a current alternative hash function; decoding a hash result; accumulating decoded results until no carry occurs during the accumulation; and selecting a current alternative hash function with no carry generated as a formal hash function. The method for storing a routing table includes: dividing the routing table into a next-level node pointer portion and a prefix portion for being stored; and selecting a hash function by using the above method for selecting a hash function. The method for searching a routing table includes: directly searching an IP address to be searched according to a directly stored length of a next-level node pointer portion for storing the routing table; and reading a prefix node according to a searched result.
    Type: Grant
    Filed: July 29, 2009
    Date of Patent: December 4, 2012
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Jun Gong, Chong Zhan, Hongfei Chen, Rui Hu, Jian Zhang, Hunghsiang Jonathan Chao, Hao Su, Xiaozhong Wang, Tuanhui Sun
  • Publication number: 20120102055
    Abstract: A regular expression matching method and system, and a searching device are provided. First, the searching device performs string filtering on a data stream to be matched, in which if keywords in the data stream and preset character words have at least one same character, the searching device indicates that the data stream passes through the string filtering. Then the searching device performs regular expression filtering on the data stream passing through the string filtering. In a string filtering process through the method, system, and device, when Hash mapping positions of the keywords of the data stream are a subset of the Hash mapping positions of the character words, it indicates that the data stream passes through the string filtering, and it is not required to store the keywords and further compare the keywords with the character words, thereby saving the storage space and improving performance.
    Type: Application
    Filed: December 28, 2011
    Publication date: April 26, 2012
    Applicant: Huawei Technologies Co., Ltd.
    Inventors: Rui Hu, Jian Chen
  • Publication number: 20110103699
    Abstract: Methods and computer-readable media for propagating content category information to images stored in a database are described. A seed image that is associated with a known content category is received. A content-based image retrieval is conducted using the seed image as a search query image. A number of search result images are identified. The content category is propagated to the search result images. Metadata associated with the search result images is aggregated and analyzed to identify domains that should also be associated with the content category. Additional images that are associated with the domain are identified and the content category propagated thereto. The process is iterated using the additional images as search query images for the content-based image retrieval.
    Type: Application
    Filed: June 24, 2010
    Publication date: May 5, 2011
    Applicant: MICROSOFT CORPORATION
    Inventors: QIFA KE, MING LIU, YI LI, RUI HU, YANFENG SUN
  • Publication number: 20100058027
    Abstract: A method for selecting a hash function, a method for storing and searching a routing table and devices thereof are provided. The method for selecting a hash function includes: hashing data to be hashed by using a current alternative hash function; decoding a hash result; accumulating decoded results until no carry occurs during the accumulation; and selecting a current alternative hash function with no carry generated as a formal hash function. The method for storing a routing table includes: dividing the routing table into a next-level node pointer portion and a prefix portion for being stored; and selecting a hash function by using the above method for selecting a hash function. The method for searching a routing table includes: directly searching an IP address to be searched according to a directly stored length of a next-level node pointer portion for storing the routing table; and reading a prefix node according to a searched result.
    Type: Application
    Filed: July 29, 2009
    Publication date: March 4, 2010
    Applicant: Huawei Technologies Co. Ltd.
    Inventors: Jun Gong, Chong Zhan, Hongfei Chen, Rui Hu, Jian Zhang, Hunghsiang Jonathan Chao, Hao Su, Xiaozhong Wang, Tuanhui Sun
  • Patent number: 7539153
    Abstract: The present invention discloses a method and apparatus for longest prefix matching.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: May 26, 2009
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Jun Liang, Shijun Shen, Meng Li, Juan Zhang, Rui Hu, Jun Gong