Patents by Inventor Ruibo Wu

Ruibo Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240087228
    Abstract: A method for scheduling and displaying three-dimensional annotations is provided, relating to the field of realistic three-dimensional visualization technology. The present disclosure covers data services, data scheduling schemes, data storage schemes, annotation avoidance schemes, and annotation efficient display schemes. Users can use this disclosure to schedule and display massive three-dimensional annotations in WebGL at high frame rates while consuming extremely low performance. It solves the problem of text inversion and non-hierarchical zooming of three-dimensional maps in traditional annotation and slicing services which can cause text to appear larger or smaller, breaking through the technical bottleneck that traditional annotation and slicing services that cannot be superposition displayed on 3D models.
    Type: Application
    Filed: September 8, 2023
    Publication date: March 14, 2024
    Inventors: Rundong Liu, Ruibo Chen, Shuhong Mei, Qing Liu, Chanling Pan, Mincan He, Jinyun Chen, Lijuan He, Shuai Wu, Ziyuan Bao
  • Patent number: 9943272
    Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.
    Type: Grant
    Filed: September 23, 2017
    Date of Patent: April 17, 2018
    Inventors: Yiming Wang, Vincent Huang, Hanjie Zou, Eileen Guo, Ruibo Wu, Zhuotong Xian
  • Publication number: 20180020996
    Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.
    Type: Application
    Filed: September 23, 2017
    Publication date: January 25, 2018
    Inventors: Yiming Wang, Vincent Huang, Hanjie Zou, Eileen Guo, Ruibo Wu, Zhuotong Xian