Patents by Inventor Ruiheng ZHANG

Ruiheng ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for eddy current thermography defect reconstruction based on electrical impedance tomography
    Patent number: 12216085
    Abstract: The present invention provides a method for eddy current thermography defect reconstruction based on electrical impedance tomography, first, obtaining a thermal reference image of temperature change with time by acquiring a thermogram sequence S of the specimen in the process of heating and fitting a curve for pixels of each location of the thermogram sequence S, then, creating a current matrix and a magnetic potential matrix, and calculating the satisfied conductivity distribution through iterations, so as a reconstructed image is obtained, then taking the low conductivity area of the reconstructed image as the defect profile, thus the defect profile is identified and quantified.
    Type: Grant
    Filed: August 29, 2022
    Date of Patent: February 4, 2025
    Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
    Inventors: Libing Bai, Xu Zhang, Chao Ren, Yiping Liang, Ruiheng Zhang, Yong Duan, Jinliang Shao, Yali Zheng, Yuhua Cheng
  • METHOD FOR EDDY CURRENT THERMOGRAPHY DEFECT RECONSTRUCTION BASEED ON ELECTRICAL IMPEDANCE TOMOGRAPHY
    Publication number: 20220412919
    Abstract: The present invention provides a method for eddy current thermography defect reconstruction based on electrical impedance tomography, first, obtaining a thermal reference image of temperature change with time by acquiring a thermogram sequence S of the specimen in the process of heating and fitting a curve for pixels of each location of the thermogram sequence S, then, creating a current matrix and a magnetic potential matrix, and calculating the satisfied conductivity distribution through iterations, so as a reconstructed image is obtained, then taking the low conductivity area of the reconstructed image as the defect profile, thus the defect profile is identified and quantified.
    Type: Application
    Filed: August 29, 2022
    Publication date: December 29, 2022
    Applicant: University of Electronic Science and Technology of China
    Inventors: Libing BAI, Xu ZHANG, Chao REN, Yiping LIANG, Ruiheng ZHANG, Yong DUAN, Jinliang SHAO, Yali ZHENG, Yuhua CHENG