Abstract: A method for modelling timing behavior using augmented sensitivity data for physical parameters is disclosed. The method includes acquiring timing library data and sensitivity data for a physical parameter associated with a circuit design, generating a timing behavior model for the circuit design based on the timing library data and sensitivity data for the physical parameter, and storing the timing behavior model. The timing behavior model reduces a difference between a current known best measurement associated with the circuit design and a static timing analysis timing for the circuit design.

Abstract: A processing device determines cell boundary conditions for each of a plurality of boundaries of a cell in an integrated circuit layout and determines a layout dependent effect (LDE) impact for the cell based on the cell boundary conditions for each of the plurality of boundaries of the cell. The processing device further generates a prediction of an LDE impact on one or more contents of a library associated with the cell, and performs an LDE-aware timing analysis for the cell based on the prediction of the LDE impact on the one or more contents of the library.

Abstract: A method for modelling timing behavior using augmented sensitivity data for physical parameters is disclosed. The method includes acquiring timing library data and sensitivity data for a physical parameter associated with a circuit design, generating a timing behavior model for the circuit design based on the timing library data and sensitivity data for the physical parameter, and storing the timing behavior model. The timing behavior model reduces a difference between a current known best measurement associated with the circuit design and a static timing analysis timing for the circuit design.