Patents by Inventor Ruimin Qiao

Ruimin Qiao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11885755
    Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
    Type: Grant
    Filed: April 28, 2023
    Date of Patent: January 30, 2024
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
  • Publication number: 20230349842
    Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
    Type: Application
    Filed: April 28, 2023
    Publication date: November 2, 2023
    Inventors: Wenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
  • Patent number: 11428651
    Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample such that at least a portion of the sample is between the crystal analyzer and the detector.
    Type: Grant
    Filed: November 23, 2021
    Date of Patent: August 30, 2022
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
  • Publication number: 20220082516
    Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample.
    Type: Application
    Filed: November 23, 2021
    Publication date: March 17, 2022
    Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
  • Patent number: 11215572
    Abstract: An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.
    Type: Grant
    Filed: May 14, 2021
    Date of Patent: January 4, 2022
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
  • Publication number: 20210356412
    Abstract: An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle in a tangential plane and having a Rowland circle radius (R). The crystal analyzer includes crystal planes curved along at least one direction within at least the tangential plane with a radius of curvature substantially equal to twice the Rowland circle radius (2R). The crystal planes are configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector configured to receive at least a portion of the dispersed x-rays. The spatially resolving detector includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy.
    Type: Application
    Filed: May 14, 2021
    Publication date: November 18, 2021
    Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis