Patents by Inventor Ruiqing Sun

Ruiqing Sun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scan based test design in serdes applications
    Patent number: 11112459
    Abstract: A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.
    Type: Grant
    Filed: June 29, 2018
    Date of Patent: September 7, 2021
    Assignee: Credo Technology Group Ltd
    Inventors: Haoli Qian, Yifei Dai, Ruiqing Sun
  • SCAN BASED TEST DESIGN IN SERDES APPLICATIONS
    Publication number: 20180306862
    Abstract: A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.
    Type: Application
    Filed: June 29, 2018
    Publication date: October 25, 2018
    Applicant: Credo Technology Group Limited
    Inventors: Haoli Qian, Yifei Dai, Ruiqing Sun