Abstract: The application discloses a debugging method for pre-alignment applicable to an electronic device and the method includes: obtaining a preset voltage value which is an average voltage value of a first voltage value corresponding to a thin wafer placed on a table of the electronic device and a second voltage value corresponding to a thick wafer placed on the table of the electronic device; detecting and acquiring a first operation, and correcting a third voltage value of the electronic device according to the preset voltage value in response to the first operation so that a voltage difference between the third voltage value and the preset voltage value lies in a preset voltage range; detecting location of a flatten edge of the thick wafer on the table of the electronic device to obtain first location information, and detecting location of a flatten edge of the thin wafer on the table of the electronic device to obtain second location information; and detecting and acquiring a second operation, and correcting t