Patents by Inventor Ruize Li

Ruize Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Curved substrate bubble detection method and detection system
    Patent number: 12480886
    Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.
    Type: Grant
    Filed: March 1, 2022
    Date of Patent: November 25, 2025
    Assignee: Beijing BOE Technology Development Co., Ltd.
    Inventors: Xing Li, Ruize Li, Hao Tang, Ronghua Lan, Jiuyang Cheng, Meng Guo, Zhihui Yang, Qing Zhang, Xuehui Zhu, Quanguo Zhou, Lijia Zhou, Yong Qiao, Zhong Huang, Lirong Xu
  • CURVED SUBSTRATE BUBBLE DETECTION METHOD AND DETECTION SYSTEM
    Publication number: 20240288376
    Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.
    Type: Application
    Filed: March 1, 2022
    Publication date: August 29, 2024
    Applicant: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Xing Li, Ruize Li, Hao Tang, Ronghua Lan, Jiuyang Cheng, Meng Guo, Zhihui Yang, Qing Zhang, Xuehui Zhu, Quanguo Zhou, Lijia Zhou, Yong Qiao, Zhong Huang, Lirong Xu